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Sarvesh Bhardwaj
Sarvesh Bhardwaj
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Predictive modeling of the NBTI effect for reliable design
S Bhardwaj, W Wang, R Vattikonda, Y Cao, S Vrudhula
IEEE Custom Integrated Circuits Conference 2006, 189-192, 2006
4952006
The impact of NBTI effect on combinational circuit: Modeling, simulation, and analysis
W Wang, S Yang, S Bhardwaj, S Vrudhula, F Liu, Y Cao
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (2), 173-183, 2009
3412009
The impact of NBTI on the performance of combinational and sequential circuits
W Wang, S Yang, S Bhardwaj, R Vattikonda, S Vrudhula, F Liu, Y Cao
Proceedings of the 44th annual Design Automation Conference, 364-369, 2007
2822007
/spl tau/AU: Timing analysis under uncertainty
S Bhardwaj, SBK Vrudhula, D Blaauw
ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No …, 2003
842003
A framework for statistical timing analysis using non-linear delay and slew models
S Bhardwaj, P Ghanta, S Vrudhula
2006 IEEE/ACM International Conference on Computer Aided Design, 225-230, 2006
692006
Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits
S Bhardwaj, S Vrudhula, P Ghanta, Y Cao
Proceedings of the 43rd annual Design Automation Conference, 791-796, 2006
642006
Secure and robust localization in a wireless ad hoc environment
S Misra, G Xue, S Bhardwaj
IEEE Transactions on Vehicular Technology 58 (3), 1480-1489, 2008
532008
Leakage minimization of nano-scale circuits in the presence of systematic and random variations
S Bhardwaj, SBK Vrudhula
Proceedings of the 42nd annual Design Automation Conference, 541-546, 2005
522005
Scalable model for predicting the effect of negative bias temperature instability for reliable design
S Bhardwaj, W Wang, R Vattikonda, Y Cao, S Vrudhula
IET circuits, devices & systems 2 (4), 361-371, 2008
392008
A unified approach for full chip statistical timing and leakage analysis of nanoscale circuits considering intradie process variations
S Bhardwaj, S Vrudhula, A Goel
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
312008
Statistical leakage minimization through joint selection of gate sizes, gate lengths and threshold voltage
S Bhardwaj, Y Cao, S Vrudhula
Proceedings of the 2006 Asia and South Pacific Design Automation Conference …, 2006
282006
On timing closure: Buffer insertion for hold-violation removal
PC Wu, MDF Wong, I Nedelchev, S Bhardwaj, V Parkhe
Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014
202014
Temperature and process variations aware power gating of functional units
D Kannan, A Shrivastava, V Mohan, S Bhardwaj, S Vrudhula
21st International Conference on VLSI Design (VLSID 2008), 515-520, 2008
202008
Leakage minimization of digital circuits using gate sizing in the presence of process variations
S Bhardwaj, S Vrudhula
IEEE transactions on computer-aided design of integrated circuits and …, 2008
192008
ROSETTA: Robust and secure mobile target tracking in a wireless ad hoc environment
S Misra, S Bhardwaj, G Xue
MILCOM 2006-2006 IEEE Military Communications conference, 1-7, 2006
172006
Stochastic variational analysis of large power grids considering intra-die correlations
P Ghanta, S Vrudhula, S Bhardwaj, R Panda
2006 43rd ACM/IEEE Design Automation Conference, 211-216, 2006
162006
Fast Lagrangian relaxation based gate sizing using multi-threading
A Sharma, D Chinnery, S Bhardwaj, C Chu
2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 426-433, 2015
152015
Reducing functional unit power consumption and its variation using leakage sensors
A Shrivastava, D Kannan, S Bhardwaj, S Vrudhula
IEEE transactions on very large scale integration (VLSI) systems 18 (6), 988-997, 2009
152009
Clock-reconvergence pessimism removal in hierarchical static timing analysis
S Bhardwaj, K Rahmat, K Kucukcakar
US Patent 8,434,040, 2013
142013
Power reduction of functional units considering temperature and process variations
D Kannan, A Shrivastava, S Bhardwaj, S Vrudhula
21st International Conference on VLSI Design (VLSID 2008), 533-539, 2008
102008
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