Chris M. Fancher
Chris M. Fancher
Material Science and Technology Division, Oak Ridge National Lab
E-mail confirmado em
Citado por
Citado por
Breaking of macroscopic centric symmetry in paraelectric phases of ferroelectric materials and implications for flexoelectricity
A Biancoli, CM Fancher, JL Jones, D Damjanovic
Nature materials 14 (2), 224-229, 2015
A comprehensive study on the structural evolution of HfO 2 thin films doped with various dopants
MH Park, T Schenk, CM Fancher, ED Grimley, C Zhou, C Richter, ...
Journal of Materials Chemistry C 5 (19), 4677-4690, 2017
TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films
PD Lomenzo, Q Takmeel, C Zhou, CM Fancher, E Lambers, ...
Journal of Applied Physics 117 (13), 134105, 2015
Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes
PD Lomenzo, P Zhao, Q Takmeel, S Moghaddam, T Nishida, M Nelson, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2014
Si doped hafnium oxide—A “fragile” ferroelectric system
C Richter, T Schenk, MH Park, FA Tscharntke, ED Grimley, JM LeBeau, ...
Advanced Electronic Materials 3 (10), 1700131, 2017
The effects of layering in ferroelectric Si-doped HfO2 thin films
PD Lomenzo, Q Takmeel, C Zhou, Y Liu, CM Fancher, JL Jones, ...
Applied Physics Letters 105 (7), 072906, 2014
Ferroelectric Si-Doped HfO2 Device Properties on Highly Doped Germanium
PD Lomenzo, Q Takmeel, CM Fancher, C Zhou, NG Rudawski, ...
IEEE Electron Device Letters 36 (8), 766-768, 2015
In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films
M Wallace, RL Johnson-Wilke, G Esteves, CM Fancher, RHT Wilke, ...
Journal of Applied Physics 117 (5), 054103, 2015
Effect of Texture on Temperature‐Dependent Properties of K0.5Na0.5NbO3 Modified Bi1/2Na1/2TiO3xBaTiO3
CM Fancher, W Jo, J Rödel, JE Blendell, KJ Bowman
Journal of the American Ceramic Society 97 (8), 2557-2563, 2014
Accurate nanoscale crystallography in real-space using scanning transmission electron microscopy
JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, ...
Microscopy and Microanalysis 21 (4), 946-952, 2015
In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction
G Esteves, CM Fancher, JL Jones
Journal of Materials Research 30 (3), 340, 2015
The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction
CM Fancher, S Brewer, CC Chung, S Röhrig, T Rojac, G Esteves, ...
Acta Materialia 126, 36-43, 2017
Anomalous reduction in domain wall displacement at the morphotropic phase boundary of the piezoelectric alloy system PbTi O 3− BiSc O 3
DK Khatua, CM Fancher, JL Jones, R Ranjan
Physical Review B 93 (10), 104103, 2016
Poling effect on d33 in textured Bi0. 5Na0. 5TiO3-based materials
CM Fancher, JE Blendell, KJ Bowman
Scripta Materialia 68 (7), 443-446, 2013
Electric-field-induced structural changes in multilayer piezoelectric actuators during electrical and mechanical loading
G Esteves, CM Fancher, S Röhrig, GA Maier, JL Jones, M Deluca
Acta Materialia 132, 96-105, 2017
Use of bayesian inference in crystallographic structure refinement via full diffraction profile analysis
CM Fancher, Z Han, I Levin, K Page, BJ Reich, RC Smith, AG Wilson, ...
Scientific reports 6, 31625, 2016
Crystal structure of Si-doped HfO2
L Zhao, M Nelson, H Aldridge, T Iamsasri, CM Fancher, JS Forrester, ...
Journal of Applied Physics 115 (3), 034104, 2014
Field induced domain switching as the origin of anomalous lattice strain along non-polar direction in rhombohedral BiScO3-PbTiO3 close to the morphotropic …
L KV, CM Fancher, JL Jones, R Ranjan
Applied Physics Letters 107 (5), 052901, 2015
On the Origin of the Large Remanent Polarization in La:HfO2
T Schenk, CM Fancher, MH Park, C Richter, C Künneth, A Kersch, ...
Advanced Electronic Materials 5 (12), 1900303, 2019
Effect of Crystallographic Texture on the Field-Induced-Phase Transformation Behavior of Bi 0.5Na 0.5TiO 3−7BaTiO 3−2K 0.5 Na 0.5NbO 3
CM Fancher, T Iamsasri, JE Blendell, KJ Bowman
Materials Research Letters 1 (3), 156-160, 2013
O sistema não pode executar a operação agora. Tente novamente mais tarde.
Artigos 1–20