| Metastable crystal growth of the low temperature phase of barium metaborate from the melt Y Kozuki, M Itoh Journal of crystal growth 114 (4), 683-686, 1991 | 37 | 1991 |
| Measurement of ultrasound velocity in the single crystal of black phosphorus up to 3.3 GPa gas pressure Y Kôzuki, Y Hanayama, M Kimura, T Nishitake, S Endo Journal of the Physical Society of Japan 60 (5), 1612-1618, 1991 | 37 | 1991 |
| Dicing of wafers by patented water-jet-guided laser: the total damage-free cut B Richerzhagen Proc. of the 65^< th> The Laser Materials Processing Conference, 2006, 197-200, 2006 | 12 | 2006 |
| Generation of large volume hydrostatic pressure to 8 GPa for ultrasonic studies Y Kozuki, A Yoneda, A Fujimura, H Sawamoto, M Kumazawa Japanese journal of applied physics 25 (9R), 1427, 1986 | 12 | 1986 |
| Gentle dicing of thin semiconductor materials by water-jet-guided laser Y Kozuki Proceedings of LAMP2006, Kyoto, May 16-19, 2006 | 8 | 2006 |
| Implementation of Short-Pulse Lasers for Wafer Scribing and Grooving Applications M Gobet, S Obi, M Pavius, M Takano, N Vago, K Lee, Y Kozuki, ... J. Laser Micro/Nanoengineering 5 (1), 16-20, 2010 | 7 | 2010 |
| The use of sandwich-type composite metal gaskets in an MA8 type apparatus to generate 15 GPa in a 1.8 cm3 sample volume. A Yoneda, M Kato, Y Kozuki, H Sawamoto, M Kumazawa, R Makino High Temperatures-High Pressures 18 (3), 301-310, 1986 | 5 | 1986 |
| Cu spin cleaning evaluation by SOR X-ray fluorescence analysis H Hayashi, K Tsugane, Y Kagoshima, T Koyama, M Watanabe, Y Kozuki Solid State Phenomena 103, 217-220, 2005 | 2 | 2005 |
| Surface Characterization in the Silicon Cleaning Process by a-UPC; Atmospheric Ultraviolet Photoelectron Counting Y Kozuki Ultra Clean Processing of Silicon Surface, 1999 | 2 | 1999 |
| Nonlinear optical material β-BaB2O4 (BBO) Y Kozuki, M Itoh Nonlinear optics 1 (2), 187-193, 1991 | 2 | 1991 |
| Semiconductor chip with a porous single crystal layer and manufacturing method of the same K Oyu, K Hamada, K Okonogi, H Miyake, Y Kozuki, M Watanabe US Patent 7,632,696, 2009 | | 2009 |
| Single spin silicon etching behavior analysis by quality engineering (Taguchi method) S ITOH, M TAKANO, Y KOZUKI, M WATANABE, R MATSUMOTO, ... Proceedings-Electrochemical Society, 357-366, 2004 | | 2004 |
