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Michael M Njuki
Michael M Njuki
Other namesDr. Michael Njuki
Intel Corporation & Binghamton University
Verified email at binghamton.edu - Homepage
Title
Cited by
Cited by
Year
Understanding and preventing Cu–Sn micro joint defects through design and process control
M Njuki, S Thekkut, R Das, N Shahane, P Thompson, K Mirpuri, ...
Journal of Applied Electrochemistry, 1-13, 2022
142022
Enhanced voiding in Cu-Sn micro joints
M Njuki, S Thekkut, R Sivasubramony, CM Greene, N Shahane, ...
Materials Research Bulletin 150, 111759, 2022
112022
Effect of Intermetallic Morphology Evolution on Void Formation in Ni/Sn/Ni Micro Joints
S Thekkut, R Das, M Njuki, J Li, RS Sivasubramony, FW Alshatnawi, ...
2020 IEEE 70th Electronic Components and Technology Conference (ECTC), 485-491, 2020
72020
Preventing Void Growth Between Ni3Sn4 and Solder
M Njuki, S Thekkut, R Das, P Borgesen, N Dimitrov
Journal of Electronic Materials 51 (11), 6333-6346, 2022
62022
Copper-Based Nanomaterials for Fine-Pitch Interconnects in Microelectronics
E Castillo, M Njuki, AF Pasha, N Dimitrov
Accounts of Chemical Research 56 (12), 1384-1394, 2023
52023
A Study of Reliability Issues in Alternative Fine Pitch Solder Joint Interconnect Technology for System-In-Packages (SIPS)
MM Njuki
State University of New York at Binghamton, 2023
12023
Factors Controlling the Defect Formation in Cu-Sn Micro Joints in 2.5 D and 3D Interconnects
M Njuki, S Thekkut, P Borgesen, N Dimitrov
Electrochemical Society Meeting Abstracts 240, 930-930, 2021
12021
All-Electrochemical Synthesis of SnBi/SnAgCu Structures for Low-Temperature Formation of High-Reliability Solder Microjoints
M Njuki, A Pasha, R Das, P Borgesen, N Dimitrov
Journal of Alloys and Compounds, 174699, 2024
2024
Nanoporous Cu-Sn Intermetallic Material for Interconnects in Electronic Packaging
N Dimitrov, E Castillo, M Njuki, AF Pasha
Electrochemical Society Meeting Abstracts 244, 1279-1279, 2023
2023
Void Formation in Ni3Sn4 based Micro Joints
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