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Dhruva Acharyya
Dhruva Acharyya
Advantest Corporation
E-mail confirmado em advantest.com
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A 5.3 GHz 8T-SRAM with operation down to 0.41 V in 65nm CMOS
L Chang, Y Nakamura, RK Montoye, J Sawada, AK Martin, K Kinoshita, ...
2007 IEEE Symposium on VLSI Circuits, 252-253, 2007
2052007
Detecting Trojans Through Leakage Current Analysis Using Multiple Supply Pads
J Aarestad, D Acharyya, R Rad, J Plusquellic
IEEE Transactions on information forensics and security 5 (4), 893-904, 2010
2002010
A physical unclonable function defined using power distribution system equivalent resistance variations
R Helinski, D Acharyya, J Plusquellic
Proceedings of the 46th Annual Design Automation Conference, 676-681, 2009
1492009
A test structure for characterizing local device mismatches
K Agarwal, F Liu, C McDowell, S Nassif, K Nowka, M Palmer, D Acharyya, ...
2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers., 67-68, 2006
1402006
Rigorous extraction of process variations for 65-nm CMOS design
W Zhao, F Liu, K Agarwal, D Acharyya, SR Nassif, KJ Nowka, Y Cao
IEEE Transactions on Semiconductor Manufacturing 22 (1), 196-203, 2009
1382009
HELP: A hardware-embedded delay PUF
J Aarestad, P Ortiz, D Acharyya, J Plusquellic
IEEE Design & Test 30 (2), 17-25, 2013
552013
System and methods for generating unclonable security keys in integrated circuits
J Plusquellic, DJ Acharyya, RL Helinski
US Patent 8,610,454, 2013
442013
Impedance profile of a commercial power grid and test system
D Acharyya, J Plusquellic
International Test Conference, 2003. Proceedings. ITC 2003., 709-709, 2003
272003
A transmission gate physical unclonable function and on-chip voltage-to-digital conversion technique
R Chakraborty, C Lamech, D Acharyya, J Plusquellic
Proceedings of the 50th Annual Design Automation Conference, 1-10, 2013
232013
Hardware results demonstrating defect detection using power supply signal measurements
D Acharyya, J Plusquellic
23rd IEEE VLSI Test Symposium (VTS'05), 433-438, 2005
192005
Error-tolerant bit generation techniques for use with a hardware-embedded path delay PUF
J Aarestad, J Plusquellic, D Acharyya
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
172013
On-chip jitter and oscilloscope circuits using an asynchronous sample clock
JD Schaub, FH Gebara, TY Nguyen, I Vo, J Pena, DJ Acharyya
ESSCIRC 2008-34th European Solid-State Circuits Conference, 126-129, 2008
172008
Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks
DJ Acharyya, SR Nassif, RM Rao
US Patent 7,550,987, 2009
152009
Defect diagnosis using a current ratio based quiescent signal analysis model for commercial power grids
C Patel, E Staroswiecki, S Pawar, D Acharyya, J Plusquellic
Journal of Electronic Testing 19, 611-623, 2003
142003
Quality metric evaluation of a physical unclonable function derived from an IC's power distribution system
R Helinski, D Acharyya, J Plusquellic
Proceedings of the 47th Design Automation Conference, 240-243, 2010
132010
Quiescent-signal analysis: a multiple supply pad IDDQ method
J Plusquellic, D Acharyya, A Singh, M Tehranipoor, C Patel
IEEE Design & Test of Computers 23 (4), 278-293, 2006
122006
Calibrating power supply signal measurements for process and probe card variations
D Acharyya, J Plusquellic
Proceedings. 2004 IEEE International Workshop on Current and Defect Based …, 2004
122004
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
J Aarestad, C Lamech, J Plusquellic, D Acharyya, K Agarwal
Proceedings of the 48th Design Automation Conference, 534-539, 2011
102011
Hardware results demonstrating defect localization using power supply signal measurements
D Acharyya, J Plusquellic
ISTFA 2004, 58-66, 2004
102004
Design considerations for PD/SOI SRAM: Impact of gate leakage and threshold voltage variation
R Kanj, RV Joshi, J Sivagnaname, JB Kuang, D Acharyya, TY Nguyen, ...
IEEE transactions on semiconductor manufacturing 21 (1), 33-40, 2008
92008
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