Hugh Simons
Hugh Simons
Associate Professor, Department of Physics, Technical University of Denmark
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Dark-field X-ray microscopy for multiscale structural characterization
H Simons, A King, W Ludwig, C Detlefs, W Pantleon, S Schmidt, F Stöhr, ...
Nature communications 6 (1), 1-6, 2015
Electric-field-induced strain mechanisms in lead-free
H Simons, J Daniels, W Jo, R Dittmer, A Studer, M Avdeev, J Rödel, ...
Applied Physics Letters 98 (8), 082901, 2011
A High‐Temperature‐Capacitor Dielectric Based on K0.5Na0.5NbO3‐Modified Bi1/2Na1/2TiO3–Bi1/2K1/2TiO3
R Dittmer, EM Anton, W Jo, H Simons, JE Daniels, M Hoffman, J Pokorny, ...
Journal of the American Ceramic Society 95 (11), 3519-3524, 2012
Origin of large recoverable strain in 0.94(Bi0.5Na0.5)TiO3-0.06BaTiO3 near the ferroelectric-relaxor transition
H Simons, JE Daniels, J Glaum, AJ Studer, JL Jones, M Hoffman
Applied Physics Letters 102 (6), 062902, 2013
Dual strain mechanisms in a lead-free morphotropic phase boundary ferroelectric
J Walker, H Simons, DO Alikin, AP Turygin, VY Shur, AL Kholkin, H Ursic, ...
Scientific reports 6, 19630, 2016
Tailoring the Piezoelectric and Relaxor Properties of (Bi1/2Na1/2)TiO3–BaTiO3 via Zirconium Doping
J Glaum, H Simons, M Acosta, M Hoffman
Journal of the American Ceramic Society 96 (9), 2881-2886, 2013
Long-range symmetry breaking in embedded ferroelectrics
H Simons, AB Haugen, AC Jakobsen, S Schmidt, F Stöhr, M Majkut, ...
Nature Materials 17 (9), 814-819, 2018
Multiscale 3D characterization with dark-field x-ray microscopy
H Simons, AC Jakobsen, SR Ahl, C Detlefs, HF Poulsen
Mrs Bulletin 41 (6), 454, 2016
Temperature dependent piezoelectric response and strain–electric-field hysteresis of rare-earth modified bismuth ferrite ceramics
J Walker, H Ursic, A Bencan, B Malic, H Simons, I Reaney, G Viola, ...
Journal of Materials Chemistry C 4 (33), 7859-7868, 2016
X-ray diffraction microscopy based on refractive optics
HF Poulsen, AC Jakobsen, H Simons, SR Ahl, PK Cook, C Detlefs
Journal of Applied Crystallography 50 (5), 1441-1456, 2017
Domain fragmentation during cyclic fatigue in 94%(Bi1/2Na1/2)TiO3-6%BaTiO3
H Simons, J Glaum, JE Daniels, AJ Studer, A Liess, J Rödel, M Hoffman
Journal of Applied Physics 112 (4), 044101, 2012
Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics
S Gorfman, H Simons, T Iamsasri, S Prasertpalichat, DP Cann, H Choe, ...
Scientific reports 6, 20829, 2016
Measurement and analysis of field-induced crystallographic texture using curved position-sensitive diffraction detectors
H Simons, JE Daniels, AJ Studer, JL Jones, M Hoffman
Journal of Electroceramics 32 (4), 283-291, 2014
Ultra-low-angle boundary networks within recrystallizing grains
SR Ahl, H Simons, YB Zhang, C Detlefs, F Stöhr, AC Jakobsen, ...
Scripta Materialia 139, 87-91, 2017
Mapping of individual dislocations with dark-field X-ray microscopy
AC Jakobsen, H Simons, W Ludwig, C Yildirim, H Leemreize, L Porz, ...
Journal of Applied Crystallography 52 (1), 122-132, 2019
Simulating and optimizing compound refractive lens-based X-ray microscopes
H Simons, SR Ahl, HF Poulsen, C Detlefs
Journal of synchrotron radiation 24 (2), 392-401, 2017
Full-field hard x-ray microscopy with interdigitated silicon lenses
H Simons, F Stöhr, J Michael-Lindhard, F Jensen, O Hansen, C Detlefs, ...
Optics Communications 359, 460-464, 2016
Temperature dependent polarization reversal mechanism in 0.94(Bi1/2Na1/2)TiO3-0.06Ba(Zr0.02Ti0.98)O3 relaxor ceramics
J Glaum, H Simons, J Hudspeth, M Acosta, JE Daniels
Applied Physics Letters 107 (23), 232906, 2015
Multilayer Laue lenses at high X-ray energies: performance and applications
KT Murray, AF Pedersen, I Mohacsi, C Detlefs, AJ Morgan, M Prasciolu, ...
Optics express 27 (5), 7120-7138, 2019
The ESRF dark-field x-ray microscope at ID06
M Kutsal, P Bernard, G Berruyer, PK Cook, R Hino, AC Jakobsen, ...
IOP Conference Series: Materials Science and Engineering 580 (1), 012007, 2019
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