| Exploring the use of approximate TMR to mask transient faults in logic with low area overhead IAC Gomes, MGA Martins, AI Reis, FL Kastensmidt Microelectronics Reliability 55 (9-10), 2072-2076, 2015 | 51 | 2015 |
| Using only redundant modules with approximate logic to reduce drastically area overhead in TMR IAC Gomes, M Martins, A Reis, FL Kastensmidt 2015 16th Latin-American Test Symposium (LATS), 1-6, 2015 | 26 | 2015 |
| Methodology for achieving best trade-off of area and fault masking coverage in ATMR IAC Gomes, M Martins, FL Kastensmidt, A Reis, R Ribas, SP Novalès 2014 15th Latin American Test Workshop-LATW, 1-6, 2014 | 24 | 2014 |
| Improving approximate-TMR using multi-objective optimization genetic algorithm I Albandes, A Serrano-Cases, AJ Sánchez-Clemente, M Martins, ... 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018 | 16 | 2018 |
| Reducing TMR overhead by combining approximate circuit, transistor topology and input permutation approaches IAC Gomes, FGL Kastensmidt 2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI), 1-6, 2013 | 16 | 2013 |
| Design of approximate-TMR using approximate library and heuristic approaches I Albandes, A Serrano-Cases, M Martins, A Martínez-Álvarez, ... Microelectronics Reliability 88, 898-902, 2018 | 9 | 2018 |
| Building ATMR circuits using approximate library and heuristic approaches I Albandes, M Martins, S Cuenca-Asensi, FL Kastensmidt Microelectronics Reliability 97, 24-30, 2019 | 5 | 2019 |
| Use of approximate triple modular redundancy for fault tolerance in digital circuits IAC Gomes | 1 | 2018 |
| Uso de redundância modular tripla aproximada para tolerância a falhas em circuitos digitais IAC Gomes | 1 | 2014 |
| Use of Approximate Triple Modular Redundancy for Fault Tolerance in Digital Circuits I Albandes Universidad de Alicante, 2018 | | 2018 |
