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Cristina Meinhardt
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Design of regular layouts to improve predictability
C Menezes, C Meinhardt, R Reis, R Tavares
2006 International Caribbean Conference on Devices, Circuits and Systems, 67-72, 2006
912006
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations
C Meinhardt, AL Zimpeck, RAL Reis
Microelectronics Reliability 54 (9-10), 2319-2324, 2014
632014
A low-cost solution for deploying processor cores in harsh environments
M Violante, C Meinhardt, R Reis, MS Reorda
IEEE Transactions on Industrial Electronics 58 (7), 2617-2626, 2011
472011
A low-cost SEE mitigation solution for soft-processors embedded in systems on pogrammable chips
MS Reorda, M Violante, C Meinhardt, R Reis
2009 Design, Automation & Test in Europe Conference & Exhibition, 352-357, 2009
362009
Impact of PVT variability on 20 nm FinFET standard cells
AL Zimpeck, C Meinhardt, RAL Reis
Microelectronics Reliability 55 (9-10), 1379-1383, 2015
332015
Impact of different transistor arrangements on gate variability
AL Zimpeck, C Meinhardt, L Artola, G Hubert, FL Kastensmidt, RAL Reis
Microelectronics Reliability 88, 111-115, 2018
312018
Logic synthesis meets machine learning: Trading exactness for generalization
S Rai, WL Neto, Y Miyasaka, X Zhang, M Yu, Q Yi, M Fujita, GB Manske, ...
2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021
292021
Impact of gate workfunction fluctuation on FinFET standard cells
C Meinhardt, AL Zimpeck, R Reis
2014 21st IEEE International Conference on Electronics, Circuits and Systems …, 2014
252014
FinFET basic cells evaluation for regular layouts
C Meinhardt, R Reis
2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS), 1-4, 2013
252013
Evaluation of variability using schmitt trigger on full adders layout
LB Moraes, AL Zimpeck, C Meinhardt, R Reis
Microelectronics reliability 88, 116-121, 2018
242018
Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies
RB Almeida, CM Marques, PF Butzen, FRG Silva, RAL Reis, C Meinhardt
Microelectronics Reliability 88, 196-202, 2018
232018
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology
YQ De Aguiar, L Artola, G Hubert, C Meinhardt, FL Kastensmidt, RAL Reis
Microelectronics Reliability 76, 660-664, 2017
232017
FinFET cells with different transistor sizing techniques against PVT variations
AL Zimpeck, C Meinhardt, G Posser, R Reis
2016 IEEE International Symposium on Circuits and Systems (ISCAS), 45-48, 2016
222016
Radiation sensitivity of XOR topologies in multigate technologies under voltage variability
YQ de Aguiar, C Meinhardt, RAL Reis
2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2017
182017
Pros and cons of schmitt trigger inverters to mitigate pvt variability on full adders
SP Toledo, AL Zimpeck, R Reis, C Meinhardt
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018
162018
PVT variability analysis of FinFET and CMOS XOR circuits at 16nm
FGRG da Silva, PF Butzen, C Meinhardt
2016 IEEE International Conference on Electronics, Circuits and Systems …, 2016
162016
Fast logic optimization using decision trees
BA De Abreu, A Berndt, IS Campos, C Meinhardt, JT Carvalho, M Grellert, ...
2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021
152021
Circuit-level hardening techniques to mitigate soft errors in finfet logic gates
AL Zimpeck, L Artola, G Hubert, C Meinhardt, FL Kastensmidt, R Reis
2019 19th European Conference on Radiation and Its Effects on Components and …, 2019
142019
Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices
AL Zimpeck, C Meinhardt, R Reis
2014 24th International Workshop on Power and Timing Modeling, Optimization …, 2014
132014
Accuracy and size trade-off of a cartesian genetic programming flow for logic optimization
A Berndt, IS Campos, B Lima, M Grellert, JT Carvalho, C Meinhardt, ...
2021 34th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2021
102021
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