| Fault detection, diagnosis and prediction in electrical valves using self-organizing maps LF Gonçalves, JL Bosa, TR Balen, MS Lubaszewski, EL Schneider, ... Journal of Electronic Testing 27, 551-564, 2011 | 49 | 2011 |
| Applying the oscillation test strategy to FPAA’s configurable analog blocks TR Balen, AQ Andrade, F AzaÏs, M Lubaszewski, M Renovell Journal of Electronic Testing 21, 135-146, 2005 | 25 | 2005 |
| A self-checking scheme to mitigate single event upset effects in SRAM-based FPAAs TR Balen, F Leite, FL Kastensmidt, M Lubaszewski IEEE transactions on nuclear science 56 (4), 1950-1957, 2009 | 21 | 2009 |
| Using bulk built-in current sensors and recomputing techniques to mitigate transient faults in microprocessors F Leite, T Balen, M Herve, M Lubaszewski, G Wirth 2009 10th Latin American Test Workshop, 1-6, 2009 | 21 | 2009 |
| Built-in self-test of field programmable analog arrays based on transient response analysis TR Balen, JV Calvano, MS Lubaszewski, M Renovell Journal of Electronic Testing 23, 497-512, 2007 | 21 | 2007 |
| Functional test of field programmable analog arrays TR Balen, JV Calvano, MS Lubaszewski, M Renovelf 24th IEEE VLSI Test Symposium, 6 pp.-333, 2006 | 19 | 2006 |
| Built-in self-test of global interconnects of field programmable analog arrays A Andrade Jr, G Vieira, TR Balen, M Lubaszewski, F Azaïs, M Renovell Microelectronics Journal 36 (12), 1112-1123, 2005 | 18 | 2005 |
| Testing the interconnect networks and I/O resources of field programmable analog arrays G Pereira, M Lubaszewski, A Andrade, TR Balen, F Azaïs, M Renovell 23rd IEEE VLSI Test Symposium (VTS'05), 389-394, 2005 | 17 | 2005 |
| Exploring design diversity redundancy to improve resilience in mixed-signal systems CP Chenet, LA Tambara, GM de Borges, F Kastensmidt, MS Lubaszewski, ... microelectronics Reliability 55 (12), 2833-2844, 2015 | 16 | 2015 |
| Testing the configurable analog blocks of field programmable analog arrays T Balen, A Andrade, F Azaïs, M Lubaszewski, M Renovell 2004 International Conferce on Test, 893-902, 2004 | 16 | 2004 |
| An approach to the built-in self-test of field programmable analog arrays T Balen, A Andrade, F Azaïs, M Lubaszewski, M Renovell 22nd IEEE VLSI Test Symposium, 2004. Proceedings., 383-388, 2004 | 15 | 2004 |
| Single event transient effects on charge redistribution SAR ADCs TE Becker, AJC Lanot, GS Cardoso, TR Balen Microelectronics Reliability 73, 22-35, 2017 | 14 | 2017 |
| Analyzing the behavior of FinFET SRAMs with resistive defects TS Copetti, TR Balen, GC Medeiros, LMB Poehls 2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017 | 13 | 2017 |
| Analysis of the effects of single event transients on an sar-adc based on charge redistribution AJC Lanot, TR Balen 2014 15th Latin American Test Workshop-LATW, 1-5, 2014 | 12 | 2014 |
| Reliability Analysis of 0.5 μm CMOS Operational Amplifiers under TID Effects GS Cardoso, TR Balen, MS Lubaszewski, OL Gonçalez Journal of Integrated Circuits and Systems 9 (1), 70-79, 2014 | 12 | 2014 |
| TID effects on a data acquisition system with design diversity redundancy CJ Gonzalez, RG Vaz, MB Oliveira, VW Leorato, OL Goncalez, TR Balen IEEE Transactions on Nuclear Science 65 (1), 583-590, 2017 | 11 | 2017 |
| Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC L Tambara, F Kastensmidt, P Rech, T Balen, M Lubaszewski 2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 188-193, 2013 | 11 | 2013 |
| Low-voltage dynamic comparator using positive feedback bulk effect on a floating inverter amplifier B Canal, HD Klimach, S Bampi, TR Balen Analog integrated circuits and signal processing 108 (3), 511-524, 2021 | 10 | 2021 |
| Radiation effects in low power and ultra-low power voltage references D Fusco, TR Balen Journal of Low Power Electronics 12 (4), 403-412, 2016 | 10 | 2016 |
| Qualification of electronic components with respect to the cosmic radiation tolerance for space applications OL Gonçalez, ECF PEREIRA JUNIOR, RG VAZ, MA PEREIRA, GI WIRTH, ... 4º Workshop sobre os efeitos da radiação ionizante em componentes …, 2012 | 10 | 2012 |
