| Impact of variability on processor performance in negative capacitance finfet technology H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ... IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020 | 64 | 2020 |
| Impact of extrinsic variation sources on the device-to-device variation in ferroelectric FET K Ni, A Gupta, O Prakash, S Thomann, XS Hu, H Amrouch 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 56 | 2020 |
| On the channel percolation in ferroelectric FET towards proper analog states engineering K Ni, S Thomann, O Prakash, Z Zhao, S Deng, H Amrouch 2021 IEEE International Electron Devices Meeting (IEDM), 15.3. 1-15.3. 4, 2021 | 40 | 2021 |
| Temperature dependence and temperature-aware sensing in ferroelectric FET A Gupta, K Ni, O Prakash, XS Hu, H Amrouch 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 40 | 2020 |
| Impact of interface traps on negative capacitance transistor: Device and circuit reliability O Prakash, A Gupta, G Pahwa, J Henkel, YS Chauhan, H Amrouch IEEE Journal of the Electron Devices Society 8, 1193-1201, 2020 | 38 | 2020 |
| Transistor self-heating: The rising challenge for semiconductor testing O Prakash, CK Dabhi, YS Chauhan, H Amrouch 2021 IEEE 39th VLSI Test Symposium (VTS), 1-7, 2021 | 34 | 2021 |
| Prevalence of depression in mothers of intellectually disabled children: A cross-sectional study G Chandravanshi, KK Sharma, CS Jilowa, PS Meena, M Jain, O Prakash Medical Journal of Dr. DY Patil University 10 (2), 156-161, 2017 | 28 | 2017 |
| Photophysical Integrity of the Iron(III) Scorpionate Framework in Iron(III)–NHC Complexes with Long-Lived 2LMCT Excited States O Prakash, L Lindh, N Kaul, NW Rosemann, IB Losada, C Johnson, ... Inorganic Chemistry 61 (44), 17515-17526, 2022 | 25 | 2022 |
| Impact of self-heating on negative-capacitance finfet: Device-circuit interaction O Prakash, G Pahwa, CK Dabhi, YS Chauhan, H Amrouch IEEE Transactions on Electron Devices 68 (4), 1420-1424, 2021 | 25 | 2021 |
| Effect of Raj Yoga meditation on affective & cognitive functions N Misra, A Gupta, S Alreja, O Prakash International Journal of Heath Sciences and Research 3 (2), 38-46, 2013 | 25 | 2013 |
| On the reliability of in-memory computing: Impact of temperature on ferroelectric TCAM S Thomann, C Li, C Zhuo, O Prakash, X Yin, XS Hu, H Amrouch 2021 IEEE 39th VLSI Test Symposium (VTS), 1-6, 2021 | 21 | 2021 |
| Compact NBTI reliability modeling in Si nanowire MOSFETs and effect in circuits O Prakash, S Beniwal, S Maheshwaram, A Bulusu, N Singh, SK Manhas IEEE Transactions on Device and Materials Reliability 17 (2), 404-413, 2017 | 21 | 2017 |
| Personality disorder, emotional intelligence, and locus of control of patients with alcohol dependence O Prakash, N Sharma, AR Singh, KS Sengar, S Chaudhury, JK Ranjan Industrial psychiatry journal 24 (1), 40-47, 2015 | 21 | 2015 |
| Reliability challenges with self-heating and aging in finfet technology H Amrouch, VM van Santen, O Prakash, H Kattan, S Salamin, S Thomann, ... 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 20 | 2019 |
| A study of mental health problems in criminals in terms of depression, anxiety and stress N Sharma, O Prakash, KS Sengar, AR Singh Glob J Hum Soc Sci Res 15 (9), 17-22, 2015 | 18 | 2015 |
| Performance optimization of analog circuits in negative capacitance transistor technology O Prakash, N Chauhan, A Gupta, H Amrouch Microelectronics Journal 115, 105193, 2021 | 16 | 2021 |
| Traps based reliability barrier on performance and revealing early ageing in negative capacitance FET A Gupta, G Bajpai, P Singhal, N Bagga, O Prakash, S Banchhor, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 13 | 2021 |
| Ferrous and ferric complexes with cyclometalating N-heterocyclic carbene ligands: a case of dual emission revisited CE Johnson, J Schwarz, M Deegbey, O Prakash, K Sharma, P Huang, ... Chemical Science 14 (37), 10129-10139, 2023 | 12 | 2023 |
| Impact of NBTI aging on self-heating in nanowire FET O Prakash, H Amrouch, S Manhas, J Henkel 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020 | 12 | 2020 |
| Cleaved-gate ferroelectric FET for reliable multi-level cell storage N Bagga, K Ni, N Chauhan, O Prakash, XS Hu, H Amrouch 2022 IEEE International Reliability Physics Symposium (IRPS), P5-1-P5-5, 2022 | 11 | 2022 |
Bulusu AnandIndian Institute of Technology RoorkeeE-mail confirmado em ece.iitr.ac.in
