Seguir
Wei Yao
Wei Yao
Semiconductor
E-mail confirmado em buffalo.edu
Título
Citado por
Citado por
Ano
Computational damage mechanics of electromigration and thermomigration
W Yao, C Basaran
Journal of Applied Physics 114 (10), 2013
772013
Electromigration analysis of solder joints under ac load: A mean time to failure model
W Yao, C Basaran
Journal of Applied Physics 111 (6), 2012
562012
Electromigration damage mechanics of lead-free solder joints under pulsed DC: A computational model
W Yao, C Basaran
Computational Materials Science 71, 76-88, 2013
382013
Damage mechanics of electromigration and thermomigration in lead-free solder alloys under alternating current: An experimental study
W Yao, C Basaran
International Journal of Damage Mechanics 23 (2), 203-221, 2014
282014
Thermodynamics theory for damage evolution in solids
C Basaran, S Nie, J Gomez, E Gunel, S Li, M Lin, H Tang, C Yan, W Yao, ...
Springer New York, 2015
192015
Electromigration in lead-free solder joints under high-frequency pulse current: An experimental study
W Yao, C Basaran
International Journal of Damage Mechanics 22 (8), 1127-1143, 2013
112013
Reduced impedance and superconductivity of SnAgCu solder alloy at high frequency
W Yao, C Basaran
Electronic Materials Letters 8, 503-505, 2012
112012
Electric pulse induced impedance and material degradation in IC chip packaging
W Yao, C Basaran
Electronic Materials Letters 9, 565-568, 2013
72013
Damage of SAC405 solder joint under PDC
W Yao, C Basaran
13th InterSociety Conference on Thermal and Thermomechanical Phenomena in …, 2012
62012
Skin effect and material degradation of lead-free solder joint under AC
Y Wei, B Cemal
13th InterSociety Conference on Thermal and Thermomechanical Phenomena in …, 2012
52012
Mean time to failure of SnAgCuNi solder joints under DC
C Basaran, S Li, DC Hopkins, W Yao
13th InterSociety Conference on Thermal and Thermomechanical Phenomena in …, 2012
42012
O sistema não pode executar a operação agora. Tente novamente mais tarde.
Artigos 1–11