| Robust structural identification via polyhedral template matching PM Larsen, S Schmidt, J Schiøtz Modelling and Simulation in Materials Science and Engineering 24 (5), 055007, 2016 | 709 | 2016 |
| Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders HF Poulsen, SF Nielsen, EM Lauridsen, S Schmidt, RM Suter, U Lienert, ... Journal of applied crystallography 34 (6), 751-756, 2001 | 406 | 2001 |
| X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case W Ludwig, S Schmidt, EM Lauridsen, HF Poulsen Journal of Applied Crystallography 41 (2), 302-309, 2008 | 312 | 2008 |
| Watching the growth of bulk grains during recrystallization of deformed metals S Schmidt, SF Nielsen, C Gundlach, L Margulies, X Huang, DJ Jensen Science 305 (5681), 229-232, 2004 | 291 | 2004 |
| Dark-field X-ray microscopy for multiscale structural characterization H Simons, A King, W Ludwig, C Detlefs, W Pantleon, S Schmidt, F Stöhr, ... Nature communications 6 (1), 6098, 2015 | 241 | 2015 |
| Tracking: a method for structural characterization of grains in powders or polycrystals EM Lauridsen, S Schmidt, RM Suter, HF Poulsen Journal of applied crystallography 34 (6), 744-750, 2001 | 235 | 2001 |
| Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction J Oddershede, S Schmidt, HF Poulsen, HO Sørensen, J Wright, ... Journal of Applied Crystallography 43 (3), 539-549, 2010 | 228 | 2010 |
| New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging W Ludwig, A King, P Reischig, M Herbig, EM Lauridsen, S Schmidt, ... Materials Science and Engineering: A 524 (1-2), 69-76, 2009 | 208 | 2009 |
| Lattice rotations of individual bulk grains: Part I: 3D X-ray characterization HF Poulsen, L Margulies, S Schmidt, G Winther Acta Materialia 51 (13), 3821-3830, 2003 | 180 | 2003 |
| Lattice rotations of individual bulk grains Part II: correlation with initial orientation and model comparison G Winther, L Margulies, S Schmidt, HF Poulsen Acta Materialia 52 (10), 2863-2872, 2004 | 168 | 2004 |
| Three-dimensional orientation mapping in the transmission electron microscope HH Liu, S Schmidt, HF Poulsen, A Godfrey, ZQ Liu, JA Sharon, X Huang Science 332 (6031), 833-834, 2011 | 140 | 2011 |
| Multigrain crystallography HO Sørensen, S Schmidt, JP Wright, GBM Vaughan, S Techert, ... Oldenbourg Wissenschaftsverlag GmbH 227 (1), 63-78, 2012 | 130 | 2012 |
| GrainSpotter: a fast and robust polycrystalline indexing algorithm S Schmidt Journal of Applied Crystallography 47 (1), 276-284, 2014 | 128 | 2014 |
| X-ray microscopy in four dimensions DJ Jensen, EM Lauridsen, L Margulies, HF Poulsen, S Schmidt, ... Materials Today 9 (1-2), 18-25, 2006 | 103 | 2006 |
| Long-range symmetry breaking in embedded ferroelectrics H Simons, AB Haugen, AC Jakobsen, S Schmidt, F Stöhr, M Majkut, ... Nature materials 17 (9), 814-819, 2018 | 101 | 2018 |
| Direct observation of 3-D grain growth in Al–0.1% Mn S Schmidt, UL Olsen, HF Poulsen, HO Sørensen, EM Lauridsen, ... Scripta Materialia 59 (5), 491-494, 2008 | 96 | 2008 |
| McXtrace: a Monte Carlo software package for simulating X-ray optics, beamlines and experiments E Bergbäck Knudsen, A Prodi, J Baltser, M Thomsen, P Kjær Willendrup, ... Journal of Applied Crystallography 46 (3), 679-696, 2013 | 80 | 2013 |
| Non-destructive characterization of recrystallization kinetics using three-dimensional X-ray diffraction microscopy EM Lauridsen, S Schmidt, SF Nielsen, L Margulies, HF Poulsen, ... Scripta materialia 55 (1), 51-56, 2006 | 79 | 2006 |
| Measuring the stress field around an evolving crack in tensile deformed Mg AZ31 using three-dimensional X-ray diffraction J Oddershede, B Camin, S Schmidt, LP Mikkelsen, HO Sørensen, ... Acta materialia 60 (8), 3570-3580, 2012 | 75 | 2012 |
| Grain-resolved elastic strains in deformed copper measured by three-dimensional X-ray diffraction J Oddershede, S Schmidt, HF Poulsen, L Margulies, J Wright, M Moscicki, ... Materials characterization 62 (7), 651-660, 2011 | 74 | 2011 |
