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Co-authors
Juerg LeutholdInstitute of Electromagnetic Fields (IEF), ETH Zurich, Zurich, SwitzerlandVerified email at ethz.ch
Wolfgang HeniPolariton Technologies Ltd.Verified email at polariton.ch
Christian HaffnerBranco-Weiss Fellow, ETH Zurich, National Institute of Standards and Technology,Verified email at nist.gov
Benedikt BaeuerlePolariton Technologies Ltd.Verified email at polariton.ch
Larry DaltonProfessor of Chemistry, University of WashingtonVerified email at chem.washington.edu
Delwin ElderResearch Scientist, University of WashingtonVerified email at uw.edu
Arne JostenPhD Student of Optical Communications, ETH ZurichVerified email at ethz.ch
Alexandros EmborasLecturer, Department of Information Technology and Electrical Engineering, ETH-ZurichVerified email at ethz.ch
Christian HafnerETH ZurichVerified email at ethz.ch
Romain BonjourSwisscom InnovationVerified email at swisscom.com
Ueli KochETH Zurich, Institute of Electromagnetic Fields (IEF)Verified email at ethz.ch
Ping MaETH Zurich, SwitzerlandVerified email at ief.ee.ethz.ch
Maurizio BurlaETH ZurichVerified email at ief.ee.ethz.ch
Bojun ChengETH ZurichVerified email at ief.ee.ethz.ch
Tatsuhiko WatanabeInstitute of Electromagnetic Fields (IEF), ETH ZurichVerified email at ethz.ch
Argishti MelikyanMember of Technical Staff, Nokia Bell LabsVerified email at nokia.com
Manfred KohlProfessor of Smart Materials and Devices, Karlsruhe Institute of TechnologyVerified email at kit.edu
Changzhi LiTexas Tech UniversityVerified email at ttu.edu
Dexin YeZheJiang UniversityVerified email at zju.edu.cn
Jens NiegemannPrincipal Scientist with Lumerical Solutions Inc.Verified email at lumerical.com