Michelangelo Grosso

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Matteo SONZA REORDAPolitecnico di Torino, Dept. of Control and Computer EngineeringE-mail confirmado em polito.it
paolo bernardiPolitecnico di TorinoE-mail confirmado em polito.it
Ernesto SanchezAssociate Professor at Politecnico di TorinoE-mail confirmado em polito.it
Maurizio RebaudengoPolitecnico di TorinoE-mail confirmado em polito.it
Massimo PoncinoProfessor, Computing EngineeringE-mail confirmado em polito.it
Andrea AcquavivaFull Professor, Department of Electrical, Electronic and Information Engineering "Guglielmo Marconi"E-mail confirmado em unibo.it
Edoardo PattiDept. of Control and Computer Engineering, Politecnico di TorinoE-mail confirmado em polito.it
Luis EntrenaUniversidad Carlos IIIE-mail confirmado em ing.uc3m.es
MARTA PORTELA GARCIAUniversidad Carlos III de MadridE-mail confirmado em ing.uc3m.es
Alessandro SassoneDepartment of Computer and Control Engineering, Politecnico di TorinoE-mail confirmado em polito.it
Riccardo CantoroDepartment of Control and Computer Engineering, Politecnico di TorinoE-mail confirmado em polito.it
Danilo DemarchiFull Professor, Politecnico di TorinoE-mail confirmado em polito.it
Paolo RechTrento UniversityE-mail confirmado em unitn.it
ALESSANDRO PACCAGNELLADipartimento di Ingegneria dell'Informazione, Università di PadovaE-mail confirmado em dei.unipd.it
Jaime Velasco MedinaUniversidad del ValleE-mail confirmado em correounivalle.edu.co
Marco CrepaldiIstituto Italiano di TecnologiaE-mail confirmado em iit.it
Maria K MichaelElectrical and Computer Engineering Department, KIOS Center of Excellence, University of CyprusE-mail confirmado em ucy.ac.cy
Wilson Javier Perez HolguinUniversidad Pedagógica y Tecnológica de ColombiaE-mail confirmado em uptc.edu.co
Lorenzo BottaccioliInteruniversity Department of Regional and Urban Studies and Planning - Politecnico di TorinoE-mail confirmado em polito.it
Alberto MaciiPolitecnico di TorinoE-mail confirmado em polito.it

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Michelangelo Grosso

STMicroelectronics s.r.l.

E-mail confirmado em st.com

embedded systems test dependability


Título Ordenar por citações Ordenar por ano Ordenar por título	Citado por Citado por	Ano
System-in-package testing: problems and solutions D Appello, P Bernardi, M Grosso, MS Reorda IEEE Design & Test of Computers 23 (3), 203-211, 2006	59	2006
The energy efficiency management at urban scale by means of integrated modelling A Ronzino, A Osello, E Patti, L Bottaccioli, C Danna, A Lingua, ... Energy Procedia 83, 258-268, 2015	40	2015
Fault grading of software-based self-test procedures for dependable automotive applications P Bernardi, M Grosso, E Sánchez, O Ballan 2011 Design, Automation & Test in Europe, 1-2, 2011	37	2011
On the use of embedded debug features for permanent and transient fault resilience in microprocessors M Portela-García, M Grosso, M Gallardo-Campos, MS Reorda, L Entrena, ... Microprocessors and Microsystems 36 (5), 334-343, 2012	34	2012
A programmable BIST for DRAM testing and diagnosis P Bernardi, M Grosso, MS Reorda, Y Zhang 2010 IEEE International Test Conference, 1-10, 2010	32	2010
On-line software-based self-test of the address calculation unit in RISC processors P Bernardi, L Ciganda, M de Carvalho, M Grosso, J Lagos-Benites, ... 2012 17th IEEE European Test Symposium (ETS), 1-6, 2012	31	2012
A novel sbst generation technique for path-delay faults in microprocessors exploiting gate-and rt-level descriptions K Christou, MK Michael, P Bernardi, M Grosso, E Sánchez, MS Reorda 26th IEEE VLSI Test Symposium (vts 2008), 389-394, 2008	31	2008
An on-line fault detection technique based on embedded debug features M Grosso, MS Reorda, M Portela-Garcia, M García-Valderas, ... 2010 IEEE 16th International On-Line Testing Symposium, 167-172, 2010	30	2010
A pattern ordering algorithm for reducing the size of fault dictionaries P Bernardi, M Grosso, M Rebaudengo, MS Reorda 24th IEEE VLSI Test Symposium, 6 pp.-391, 2006	29	2006
Embedded memory diagnosis: An industrial workflow D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ... 2006 IEEE International Test Conference, 1-9, 2006	28	2006
Integrating BIST techniques for on-line SoC testing A Manzone, P Bernardi, M Grosso, M Rebaudengo, E Sánchez, ... 11th IEEE International On-Line Testing Symposium, 235-240, 2005	28	2005
Smart electronic systems: an overview A Sassone, M Grosso, M Poncino, E Macii Smart Systems Integration and Simulation, 5-21, 2016	26	2016
A top-down constraint-driven methodology for smart system design M Crepaldi, M Grosso, A Sassone, S Gallinaro, S Rinaudo, M Poncino, ... IEEE Circuits and Systems Magazine 14 (1), 37-57, 2014	26	2014
Energy-efficient battery charging in electric vehicles with solar panels M Grosso, D Lena, A Bocca, A Macii, S Rinaudo 2016 IEEE 2nd International Forum on Research and Technologies for Society …, 2016	24	2016
On the automation of the test flow of complex SoCs D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ... 24th IEEE VLSI Test Symposium, 6 pp.-171, 2006	23	2006
On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ... 2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013	22	2013
A hybrid approach for detection and correction of transient faults in SoCs P Bernardi, LB Poehls, M Grosso, MS Reorda IEEE Transactions on Dependable and Secure Computing 7 (4), 439-445, 2010	21	2010
On the automatic generation of test programs for path-delay faults in microprocessor cores P Bernardi, M Grosso, E Sánchez, MS Reorda 12th IEEE European Test Symposium (ETS'07), 179-184, 2007	18	2007
An investigation on pervasive technologies for IoT-based thermal monitoring E Giusto, F Gandino, ML Greco, M Grosso, B Montrucchio, S Rinaudo Sensors 19 (3), 663, 2019	15	2019
Exploiting fault model correlations to accelerate SEU sensitivity assessment M Grosso, H Guzman-Miranda, MA Aguirre IEEE Transactions on Industrial Informatics 9 (1), 142-148, 2012	15	2012

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