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Pritam Yogi
Pritam Yogi
Dy. Technical Officer,Dept. of Electrical Engineering, IIT Delhi
Verified email at ee.iitd.ac.in
Title
Cited by
Cited by
Year
Comparison of LER Induced Mismatch in NWFET and NSFET for 5-nm CMOS
CK Jha, P Yogi, C Gupta, A Gupta, RA Vega, A Dixit
IEEE Journal of the Electron Devices Society 8, 1184-1192, 2020
72020
Effect of Post Radiation Annealing on the TID Response of 0.18 μm bulk NFETs
K Aditya, M Kumar, CK Jha, R Singh, P Yogi, S Basra, HS Jatana, A Dixit
2019 Electron Devices Technology and Manufacturing Conference (EDTM), 336-338, 2019
42019
Impact of Hot Carrier Injection on Total Ionizing Dose Effect of 10-nm N-channel Bulk FinFETs
P Yogi, M Kumar, K Aditya, C Gupta, A Dixit
2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020
12020
Heavy-Ion Induced Single Event Transients in Sub-7nm Bulk and SOI NSFETs
CK Jha, A Rathi, P Yogi, K Aditya, A Dixit
2020 5th IEEE International Conference on Emerging Electronics (ICEE), 2020
12020
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