Comparison of LER Induced Mismatch in NWFET and NSFET for 5-nm CMOS CK Jha, P Yogi, C Gupta, A Gupta, RA Vega, A Dixit IEEE Journal of the Electron Devices Society 8, 1184-1192, 2020 | 7 | 2020 |
Effect of Post Radiation Annealing on the TID Response of 0.18 μm bulk NFETs K Aditya, M Kumar, CK Jha, R Singh, P Yogi, S Basra, HS Jatana, A Dixit 2019 Electron Devices Technology and Manufacturing Conference (EDTM), 336-338, 2019 | 4 | 2019 |