Interplay between nonlinearity, scan speed, damping, and electronics in frequency modulation atomic-force microscopy M Gauthier, R Pérez, T Arai, M Tomitori, M Tsukada
Physical review letters 89 (14), 146104, 2002
83 2002 Observation of Electronic States on Si(111)- through Short-Range Attractive Force with Noncontact Atomic Force Spectroscopy T Arai, M Tomitori
Physical review letters 93 (25), 256101, 2004
72 2004 Analysis of surface forces on oxides in aqueous solutions using AFM T Arai, D Aoki, Y Okabe, M Fujihira
Thin solid films 273 (1-2), 322-326, 1996
68 1996 Tip cleaning and sharpening processes for noncontact atomic force microscope in ultrahigh vacuum M Tomitori, T Arai
Applied surface science 140 (3-4), 432-438, 1999
54 1999 Bias dependence of Si (111) 7× 7 images observed by noncontact atomic force microscopy T Arai, M Tomitori
Applied surface science 157 (4), 207-211, 2000
51 2000 Removal of contamination and oxide layers from UHV-AFM tips T Arai, M Tomitori
Applied Physics A: Materials Science & Processing 66, S319-S323, 1998
41 1998 Effects of electric potentials on surface forces in electrolyte solutions T Arai, M Fujihira
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
40 1996 Vibrations of a molecule in an external force field N Okabayashi, A Peronio, M Paulsson, T Arai, FJ Giessibl
Proceedings of the National Academy of Sciences, 201721498, 2018
36 2018 Effect of tip shape on force-distance curves for AFM in aqueous electrolytes T Arai, M Fujihira
Journal of Electroanalytical Chemistry 374 (1-2), 269-273, 1994
35 1994 Quasi-stabilized hydration layers on muscovite mica under a thin water film grown from humid air T Arai, K Sato, A Iida, M Tomitori
Scientific Reports 7 (1), 4054, 2017
29 2017 Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density … N Okabayashi, A Gustafsson, A Peronio, M Paulsson, T Arai, FJ Giessibl
Physical Review B 93 (16), 165415, 2016
29 2016 An applicability of scanning tunneling microscopy for surface electron spectroscopy M Tomitori, M Hirade, Y Suganuma, T Arai
Surface science 493 (1-3), 49-55, 2001
29 2001 Energy spectrum of backscattered electrons excited by a field emission scanning tunneling microscope with a build-up [111]-oriented W tip M Tomitori, H Terai, T Arai
Applied surface science 144, 123-127, 1999
29 1999 Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy H Ooe, D Kirpal, DS Wastl, AJ Weymouth, T Arai, FJ Giessibl
Applied Physics Letters 109 (14), 141603, 2016
26 2016 Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy H Ooe, T Sakuishi, M Nogami, M Tomitori, T Arai
Applied Physics Letters 105 (4), 043107, 2014
23 2014 A Si nanopillar grown on a Si tip by atomic force microscopy in ultrahigh vacuum for a high-quality scanning probe T Arai, M Tomitori
Applied Physics Letters 86 (7), 073110, 2005
23 2005 Hexagonal arrangement of Ge clusters self-organized on a template of half unit cells of Si (1 1 1)-7× 7 observed by scanning tunneling microscopy ZA Ansari, T Arai, M Tomitori
Surface science 574 (2-3), L17-L22, 2005
23 2005 Simultaneous Imaging of Tunneling Current Variation by Noncontact Atomic Force Microscopy in Ultrahigh Vacuum T Arai, M Tomitori
Japanese Journal of Applied Physics 39 (6S), 3753, 2000
19 2000 Simultaneous Imaging of Tunneling Current Variation by Noncontact Atomic Force Microscopy in Ultrahigh Vacuum T Arai, M Tomitori
Appl. Phys 66, S245, 1998
19 1998 Atom-resolved analysis of an ionic KBr (001) crystal surface covered with a thin water layer by frequency modulation atomic force microscopy T Arai, M Koshioka, K Abe, M Tomitori, R Kokawa, M Ohta, H Yamada, ...
Langmuir 31 (13), 3876-3883, 2015
18 2015