Safe exploration for optimization with Gaussian processes Y Sui, A Gotovos, J Burdick, A Krause International Conference on Machine Learning, 997-1005, 2015 | 160 | 2015 |
Active learning for level set estimation A Gotovos Eidgenössische Technische Hochschule Zürich, Department of Computer Science,, 2013 | 100 | 2013 |
Efficient visual exploration and coverage with a micro aerial vehicle in unknown environments L Heng, A Gotovos, A Krause, M Pollefeys 2015 IEEE International Conference on Robotics and Automation (ICRA), 1071-1078, 2015 | 79 | 2015 |
Fully autonomous focused exploration for robotic environmental monitoring G Hitz, A Gotovos, MÉ Garneau, C Pradalier, A Krause, RY Siegwart 2014 IEEE International Conference on Robotics and Automation (ICRA), 2658-2664, 2014 | 52 | 2014 |
Systematic testing for detecting concurrency errors in Erlang programs M Christakis, A Gotovos, K Sagonas 2013 IEEE Sixth International Conference on Software Testing, Verification …, 2013 | 50 | 2013 |
Sampling from probabilistic submodular models A Gotovos ETH Zurich, 2019 | 36 | 2019 |
Test-driven development of concurrent programs using Concuerror A Gotovos, M Christakis, K Sagonas Proceedings of the 10th ACM SIGPLAN Workshop on Erlang, 51-61, 2011 | 27 | 2011 |
Non-Monotone Adaptive Submodular Maximization. A Gotovos, A Karbasi, A Krause IJCAI, 1996-2003, 2015 | 18 | 2015 |
Fast Gaussian process based gradient matching for parameter identification in systems of nonlinear ODEs P Wenk, A Gotovos, S Bauer, NS Gorbach, A Krause, JM Buhmann The 22nd International Conference on Artificial Intelligence and Statistics …, 2019 | 12 | 2019 |
Discrete sampling using semigradient-based product mixtures A Gotovos, H Hassani, A Krause, S Jegelka arXiv preprint arXiv:1807.01808, 2018 | 3 | 2018 |
Dynamic systematic testing of concurrent Erlang programs AS Gotovos | 3 | 2011 |
Fast detection of novel problematic patterns based on dictionary learning and prediction of their lithographic difficulty F de Morsier, D DeMaris, M Gabrani, N Casati Optical Microlithography XXVII 9052, 905211, 2014 | 2 | 2014 |
32ND INTERNATIONAL CONFERENCE ON MACHINE LEARNING, ICML 2015 Y Sui, JW Burdick, A Gotovos, A Krause, M Izbicki, CR Shelton, Y Ganin, ... | 1 | 2015 |
Fast detection of novel problematic patterns based on dictionary learning and boundary detection of failure regions F de Morsier, C Nathalie, D DeMaris, M Gabrani, A Gotovos, A Krause SPIE Advanced Lithography 2014, 2014 | | 2014 |