Alkis Gotovos
Alkis Gotovos
MIT CSAIL
E-mail confirmado em mit.edu - Página inicial
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Safe exploration for optimization with Gaussian processes
Y Sui, A Gotovos, J Burdick, A Krause
International Conference on Machine Learning, 997-1005, 2015
1602015
Active learning for level set estimation
A Gotovos
Eidgenössische Technische Hochschule Zürich, Department of Computer Science,, 2013
1002013
Efficient visual exploration and coverage with a micro aerial vehicle in unknown environments
L Heng, A Gotovos, A Krause, M Pollefeys
2015 IEEE International Conference on Robotics and Automation (ICRA), 1071-1078, 2015
792015
Fully autonomous focused exploration for robotic environmental monitoring
G Hitz, A Gotovos, MÉ Garneau, C Pradalier, A Krause, RY Siegwart
2014 IEEE International Conference on Robotics and Automation (ICRA), 2658-2664, 2014
522014
Systematic testing for detecting concurrency errors in Erlang programs
M Christakis, A Gotovos, K Sagonas
2013 IEEE Sixth International Conference on Software Testing, Verification …, 2013
502013
Sampling from probabilistic submodular models
A Gotovos
ETH Zurich, 2019
362019
Test-driven development of concurrent programs using Concuerror
A Gotovos, M Christakis, K Sagonas
Proceedings of the 10th ACM SIGPLAN Workshop on Erlang, 51-61, 2011
272011
Non-Monotone Adaptive Submodular Maximization.
A Gotovos, A Karbasi, A Krause
IJCAI, 1996-2003, 2015
182015
Fast Gaussian process based gradient matching for parameter identification in systems of nonlinear ODEs
P Wenk, A Gotovos, S Bauer, NS Gorbach, A Krause, JM Buhmann
The 22nd International Conference on Artificial Intelligence and Statistics …, 2019
122019
Discrete sampling using semigradient-based product mixtures
A Gotovos, H Hassani, A Krause, S Jegelka
arXiv preprint arXiv:1807.01808, 2018
32018
Dynamic systematic testing of concurrent Erlang programs
AS Gotovos
32011
Fast detection of novel problematic patterns based on dictionary learning and prediction of their lithographic difficulty
F de Morsier, D DeMaris, M Gabrani, N Casati
Optical Microlithography XXVII 9052, 905211, 2014
22014
32ND INTERNATIONAL CONFERENCE ON MACHINE LEARNING, ICML 2015
Y Sui, JW Burdick, A Gotovos, A Krause, M Izbicki, CR Shelton, Y Ganin, ...
12015
Fast detection of novel problematic patterns based on dictionary learning and boundary detection of failure regions
F de Morsier, C Nathalie, D DeMaris, M Gabrani, A Gotovos, A Krause
SPIE Advanced Lithography 2014, 2014
2014
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Artigos 1–14