| Direct growth of single-crystalline III–V semiconductors on amorphous substrates K Chen, R Kapadia, A Harker, S Desai, J Seuk Kang, S Chuang, M Tosun, ... Nature communications 7 (1), 10502, 2016 | 68 | 2016 |
| Scalable indium phosphide thin-film nanophotonics platform for photovoltaic and photoelectrochemical devices Q Lin, D Sarkar, Y Lin, M Yeung, L Blankemeier, J Hazra, W Wang, S Niu, ... ACS nano 11 (5), 5113-5119, 2017 | 37 | 2017 |
| Accurate inference with inaccurate RRAM devices: Statistical data, model transfer, and on-line adaptation G Charan, J Hazra, K Beckmann, X Du, G Krishnan, RV Joshi, NC Cady, ... 2020 57th ACM/IEEE Design Automation Conference (DAC), 1-6, 2020 | 33 | 2020 |
| A comparison of photocurrent mechanisms in quasi-metallic and semiconducting carbon nanotube pn-junctions SW Chang, J Hazra, M Amer, R Kapadia, SB Cronin ACS nano 9 (12), 11551-11556, 2015 | 26 | 2015 |
| Improving the Memory Window/Resistance Variability Trade-Off for 65nm CMOS Integrated HfO2 Based Nanoscale RRAM Devices J Hazra, M Liehr, K Beckmann, S Rafiq, N Cady 2019 IEEE International Integrated Reliability Workshop (IIRW), pp.1-4, 2020 | 17 | 2020 |
| Photocurrent spectroscopy of exciton and free particle optical transitions in suspended carbon nanotube pn-junctions SW Chang, J Theiss, J Hazra, M Aykol, R Kapadia, SB Cronin Applied Physics Letters 107 (5), 2015 | 16 | 2015 |
| Robust RRAM-based in-memory computing in light of model stability G Krishnan, J Sun, J Hazra, X Du, M Liehr, Z Li, K Beckmann, RV Joshi, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021 | 14 | 2021 |
| Impact of switching variability of 65nm CMOS integrated hafnium dioxide-based ReRAM devices on distinct level operations M Liehr, J Hazra, K Beckmann, S Rafiq, N Cady 2020 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2020 | 14 | 2020 |
| Fabrication and performance of hybrid reram-cmos circuit elements for dynamic neural networks M Liehr, J Hazra, K Beckmann, W Olin-Ammentorp, N Cady, R Weiss, ... Proceedings of the International Conference on Neuromorphic Systems, 1-4, 2019 | 14 | 2019 |
| Exploring model stability of deep neural networks for reliable RRAM-based in-memory acceleration G Krishnan, L Yang, J Sun, J Hazra, X Du, M Liehr, Z Li, K Beckmann, ... IEEE Transactions on Computers 71 (11), 2740-2752, 2022 | 9 | 2022 |
| Optimization of switching metrics for cmos integrated hfo2 based rram devices on 300 mm wafer platform J Hazra, M Liehr, K Beckmann, M Abedin, S Rafq, N Cady 2021 IEEE International Memory Workshop (IMW), 1-4, 2021 | 9 | 2021 |
| Ferroelectric Phase Content in 7 nm Hf(1−x)ZrxO2 Thin Films Determined by X‐Ray‐Based Methods V Mukundan, S Consiglio, DH Triyoso, K Tapily, ME McBriarty, ... physica status solidi (a) 218 (10), 2100024, 2021 | 7 | 2021 |
| An efficient design technique of circular convolution circuit using Vedic Mathematics and McCMOS technique J Hazra 2012 International Conference on Computer Communication and Informatics, 1-5, 2012 | 6 | 2012 |
| Design limits of in-memory computing: Beyond the crossbar G Krishnan, J Hazra, M Liehr, X Du, K Beckmann, RV Joshi, NC Cady, ... 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021 | 5 | 2021 |
| Investigation of ReRAM Variability on Flow-Based Edge Detection Computing Using HfO2-Based ReRAM Arrays S Rafiq, J Hazra, M Liehr, K Beckmann, M Abedin, JS Pannu, SK Jha, ... IEEE Transactions on Circuits and Systems I: Regular Papers 68 (7), 2900-2910, 2021 | 4 | 2021 |
| Failure Analysis of 65nm CMOS Integrated Nanoscale ReRAM Devices on a 300mm Wafer Platform M Liehr, J Hazra, K Beckmann, N Cady 2022 IEEE International Integrated Reliability Workshop (IIRW), 1-7, 2022 | 3 | 2022 |
| Implementation of high-performance and high-yield nanoscale hafnium zirconium oxide based ferroelectric tunnel junction devices on 300 mm wafer platform M Liehr, J Hazra, K Beckmann, V Mukundan, I Alexandrou, T Yeow, ... Journal of Vacuum Science & Technology B 41 (1), 2023 | 2 | 2023 |
| Impact of Atomic Layer Deposition Co-Reactant Pulse Time on 65nm CMOS Integrated Hafnium Dioxide-based Nanoscale RRAM Devices J Hazra, M Liehr, K Beckmann, S Rafiq, N Cady 2020 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2020 | 2 | 2020 |
| An evolutionary approach to drug-design using quantam binary particle swarm optimization algorithm A Ghosh, A Ghosh, A Chowdhury, J Hazra 2012 IEEE Students' Conference on Electrical, Electronics and Computer …, 2012 | 2 | 2012 |
| Design of a high speed low power linear convolution circuit using McCMOS technique J Hazra, D Kayal, A Dandapat, CK Sarkar 2011 International Conference on Multimedia, Signal Processing and …, 2011 | 2 | 2011 |
