| Effect of the MOSFET choice on conducted EMI in power converter circuits JBH Slama, M Tlig 2012 16th IEEE Mediterranean Electrotechnical Conference, 610-613, 2012 | 23 | 2012 |
| Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests M Tlig, JBH Slama, MA Belaid Microelectronics Reliability 53 (9-11), 1793-1797, 2013 | 20 | 2013 |
| Power RF N-LDMOS ageing effect on conducted electromagnetic interferences M Tlig, JBH Slama, MA Belaid 10th International Multi-Conferences on Systems, Signals & Devices 2013 …, 2013 | 10 | 2013 |
| Experimental investigation on the evolution of a conducted-EMI buck converter after thermal aging tests of the MOSFET S Douzi, M Tlig, JBH Slama Microelectronics Reliability 55 (9-10), 1391-1394, 2015 | 9 | 2015 |
| Experimental study on the EMI and switching time evolution of IGBT devices after operating aging tests M Tlig, JBH Slama, MA Belaid 2014 International Conference on Electrical Sciences and Technologies in …, 2014 | 8 | 2014 |
| Simulation of conducted EMI in SiC MOSFET buck converters before and after aging S Douzi, M Tlig, JBH Slama, M Kadi 2016 7th International Conference on Sciences of Electronics, Technologies …, 2016 | 4 | 2016 |
| Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging tests S Douzi, M Kadi, H Boulzazen, M Tlig, JBH Slama Microelectronics Reliability 100, 113398, 2019 | 3 | 2019 |
| Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests S Douzi, M Kadi, H Boulzazen, M Tlig, JBH Slama Microelectronics Reliability 88, 219-224, 2018 | 3 | 2018 |
| Development of Generic Radiating Model for Rectangular Capacitors: Magnetic Near Fields Analysis and Modeling W Labiedh, B Zitouna, M Tlig, JBH Slama Recent Topics in Electromagnetic Compatibility, 2021 | 1 | 2021 |
| Analysis and Modeling of Film Capacitor Radiation Generic Radiating Model for the Rectangular Capacitors W Labiedh, B Zitouna, M Tlig, JBH Slama Applied Computational Electromagnetics Society Journal 36 (4), 425, 2021 | 1 | 2021 |
| Modeling the evolution of conducted EMI of a buck converter after N-MOS transistor aging M Tlig, JBH Slama 2015 World Symposium on Mechatronics Engineering & Applied Physics (WSMEAP), 1-6, 2015 | 1 | 2015 |
| EMI and switching time evolution for power RF LDMOS in chopper application after accelerated tests MA Belaïd, M Tlig, JBH Slama 2014 International Conference on Electrical Sciences and Technologies in …, 2014 | 1 | 2014 |
| Integration of EM Radiation Modeling in Electronic Circuit Simulators B Zitouna, M Tlig, W Labiadh, S Hedia, JBH Slama Journal of Communications Technology, Electronics and Computer Science 2023, 2024 | | 2024 |
| Investigation on composite materials use for EMI shielding in power electronics circuits B Zitouna, T Mohamed, JBH Slama, K Moncef Microelectronics Reliability 150, 115128, 2023 | | 2023 |
| An EMC Study for Renewable Energy Applications Using AI Algorithms B Zitouna, M Tlig, S Hedia, JBH Slama 2023 IEEE International Conference on Artificial Intelligence & Green Energy …, 2023 | | 2023 |
| Study of aging time effect on the EMI evolution of power RF LDMOS transistor in DC-DC buck converter circuit M Tlig, MA Belaïd 2021 27th International Workshop on Thermal Investigations of ICs and …, 2021 | | 2021 |
| Temperature impact on reliability of power RF devices under S-band pulsed-RF test MA Belaid, M Tlig SN Applied Sciences 2 (5), 932, 2020 | | 2020 |
| Analysis of defects created at Si/SiO2 interface in a power RF LDMOS device due to temperature effects MA Belaid, M Tlig, A Almusallam 2019 International Conference on Signal, Control and Communication (SCC …, 2019 | | 2019 |
