Dietrich RT Zahn
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Photoluminescence emission and Raman response of monolayer MoS2, MoSe2, and WSe2
P Tonndorf, R Schmidt, P Böttger, X Zhang, J Börner, A Liebig, M Albrecht, ...
Optics express 21 (4), 4908-4916, 2013
11692013
Enhancement of the thermoelectric properties of PEDOT: PSS thin films by post-treatment
J Luo, D Billep, T Waechtler, T Otto, M Toader, O Gordan, E Sheremet, ...
Journal of Materials Chemistry A 1 (26), 7576-7583, 2013
2442013
The transport gap of organic semiconductors studied using the combination of direct and inverse photoemission
DRT Zahn, GN Gavrila, M Gorgoi
Chemical Physics 325 (1), 99-112, 2006
2362006
Electronic and vibrational spectroscopies applied to organic/inorganic interfaces
DRT Zahn, GN Gavrila, G Salvan
Chemical reviews 107 (4), 1161-1232, 2007
1812007
Resonant Raman spectroscopy of 3, 4, 9, 10-perylene-tetracarboxylic-dianhydride epitaxial films
R Scholz, AY Kobitski, TU Kampen, M Schreiber, DRT Zahn, G Jungnickel, ...
Physical Review B 61 (20), 13659, 2000
1592000
Barrier height engineering of Ag/GaAs (100) Schottky contacts by a thin organic interlayer
TU Kampen, S Park, DRT Zahn
Applied surface science 190 (1-4), 461-466, 2002
1362002
Resonant Raman scattering study of CdSe nanocrystals passivated with CdS and ZnS
VM Dzhagan, MY Valakh, AE Raevskaya, AL Stroyuk, SY Kuchmiy, ...
Nanotechnology 18 (28), 285701, 2007
1152007
Self-trapped exciton recombination in silicon nanocrystals
AY Kobitski, KS Zhuravlev, HP Wagner, DRT Zahn
Physical Review B 63 (11), 115423, 2001
1152001
Raman spectroscopy investigation of size effects in cubic boron nitride
T Werninghaus, J Hahn, F Richter, DRT Zahn
Applied physics letters 70 (8), 958-960, 1997
1141997
A fine size selection of brightly luminescent water-soluble Ag–In–S and Ag–In–S/ZnS quantum dots
A Raevskaya, V Lesnyak, D Haubold, V Dzhagan, O Stroyuk, N Gaponik, ...
The Journal of Physical Chemistry C 121 (16), 9032-9042, 2017
1052017
Cubic boron nitride films by dc and rf magnetron sputtering: layer characterization and process diagnostics
J Hahn, M Friedrich, R Pintaske, M Schaller, N Kahl, DRT Zahn, F Richter
Diamond and related materials 5 (10), 1103-1112, 1996
931996
Optical and magneto-optical study of nickel and cobalt ferrite epitaxial thin films and submicron structures
C Himcinschi, I Vrejoiu, G Salvan, M Fronk, A Talkenberger, DRT Zahn, ...
Journal of Applied Physics 113 (8), 084101, 2013
892013
Size effects on Raman spectra of small CdSe nanoparticles in polymer films
VM Dzhagan, MY Valakh, AE Raevskaya, AL Stroyuk, SY Kuchmiy, ...
Nanotechnology 19 (30), 305707, 2008
892008
Schottky contacts on passivated GaAs (1 0 0) surfaces: barrier height and reactivity
T Kampen, A Schüller, DRT Zahn, B Biel, J Ortega, R Pérez, F Flores
Applied surface science 234 (1-4), 341-348, 2004
872004
Analysis of molecular‐beam epitaxial growth of InAs on GaAs (100) by reflection anisotropy spectroscopy
SM Scholz, AB Müller, W Richter, DRT Zahn, DI Westwood, DA Woolf, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1992
871992
Transport gap of organic semiconductors in organic modified Schottky contacts
DRT Zahn, TU Kampen, H Méndez
Applied surface science 212, 423-427, 2003
822003
Investigation of second-and third-harmonic generation in few-layer gallium selenide by multiphoton microscopy
L Karvonen, A Säynätjoki, S Mehravar, RD Rodriguez, S Hartmann, ...
Scientific reports 5 (1), 1-8, 2015
812015
Experimental investigation and simulation of hybrid organic/inorganic Schottky diodes
A Bolognesi, A Di Carlo, P Lugli, T Kampen, DRT Zahn
Journal of Physics: Condensed Matter 15 (38), S2719, 2003
752003
Resonant Raman studies of compositional and size dispersion of CdS1− xSex nanocrystals in a glass matrix
YM Azhniuk, AG Milekhin, AV Gomonnai, VV Lopushansky, ...
Journal of Physics: Condensed Matter 16 (49), 9069, 2004
712004
Comparison of techniques to characterise the density, porosity and elastic modulus of porous low-k SiO2 xerogel films
C Murray, C Flannery, I Streiter, SE Schulz, MR Baklanov, KP Mogilnikov, ...
Microelectronic Engineering 60 (1-2), 133-141, 2002
712002
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