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Eduardo Luiz Augusto Macchione
Eduardo Luiz Augusto Macchione
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Lockstep dual-core ARM A9: Implementation and resilience analysis under heavy ion-induced soft errors
ÁB de Oliveira, GS Rodrigues, FL Kastensmidt, N Added, ELA Macchione, ...
IEEE Transactions on Nuclear Science 65 (8), 1783-1790, 2018
552018
Heavy ions induced single event upsets testing of the 28 nm Xilinx Zynq-7000 all programmable SoC
LA Tambara, FL Kastensmidt, NH Medina, N Added, VAP Aguiar, ...
2015 IEEE Radiation Effects Data Workshop (REDW), 1-6, 2015
542015
Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects
J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ...
IEEE Transactions on Nuclear Science 63 (2), 1294-1300, 2016
472016
Experimental setup for single event effects at the são paulo 8ud pelletron accelerator
VAP Aguiar, N Added, NH Medina, ELA Macchione, MH Tabacniks, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
452014
Mechanism of soybean (Glycine max L. Merrill) degreening related to maturity stage and postharvest drying temperature
P Sinnecker, N Braga, ELA Macchione, UM Lanfer-Marquez
Postharvest Biology and Technology 38 (3), 269-279, 2005
442005
Reliability on ARM processors against soft errors through SIHFT techniques
E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ...
IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016
412016
Analyzing the influence of the angles of incidence and rotation on MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA
J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ...
IEEE Transactions on Nuclear Science 64 (8), 2161-2168, 2017
382017
Ionizing radiation effects on a COTS low-cost RISC microcontroller
FGH Leite, RBB Santos, NH Medina, VAP Aguiar, RC Giacomini, N Added, ...
2017 18th IEEE Latin American Test Symposium (LATS), 1-4, 2017
262017
Experimental setups for single event effect studies
NH MEDINA, VÂP de Aguiar, N Added, F Aguirre, ELA Macchione, ...
Journal of Nuclear Physics, Material Sciences, Radiation and Applications, 2016
20*2016
SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil
VAP Aguiar, NH Medina, N Added, ELA Macchione, SG Alberton, ...
Review of Scientific Instruments 91 (5), 2020
162020
Analysis of single-event upsets in a Microsemi ProAsic3E FPGA
PRC Villa, RC Goerl, F Vargas, LB Poehls, NH Medina, N Added, ...
2017 18th IEEE Latin American Test Symposium (LATS), 1-4, 2017
162017
Spectroscopy of high-lying resonances in 9 Be by the measurement of (p, p),(p, d), and (p, α) reactions with a radioactive 8 Li beam
E Leistenschneider, A Lépine-Szily, MAG Alvarez, DR Mendes Jr, ...
Physical Review C, 0
15*
Analyzing the influence of the angles of incidence on SEU and MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA
J Tonfat, FL Kastensmidt, L Artola, G Hubert, NH Medina, N Added, ...
2016 16th European Conference on Radiation and Its Effects on Components and …, 2016
142016
Neutron radiation effects on an electronic system on module
D Lo Presti, NH Medina, MA Guazzelli, M Moralles, VAP Aguiar, ...
Review of Scientific Instruments 91 (8), 2020
132020
Reducing soft error rate of SoCs analog-to-digital interfaces with design diversity redundancy
CJ González, N Added, ELA Macchione, VAP Aguiar, FGL Kastensmidt, ...
IEEE Transactions on Nuclear Science 67 (3), 518-524, 2019
102019
Efeitos de radiação em dispositivos eletrônicos com feixes de íons pesados
VÂP Aguiar
Universidade de São Paulo, 2014
92014
Production of waveguides in LiF by MeV ion bombardment
JAM Pereira, M Cremona, S Pelli, ELA Macchione, K Koide, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2005
92005
Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID
J Benfica, B Green, BC Porcher, LB Poehls, F Vargas, NH Medina, ...
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility …, 2016
82016
First successful SEE measurements with heavy ions in Brazil
NH Medina, MAG Silveira, N Added, VAP Aguiar, R Giacomini, ...
2014 IEEE Radiation Effects Data Workshop (REDW), 1-3, 2014
82014
Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID
P Villa, E Bezerra, R Goerl, L Poehls, F Vargas, N Medina, N Added, ...
2017 11th International Workshop on the Electromagnetic Compatibility of …, 2017
72017
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