| Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3–4 nm wide fins and 20 nm gate length for quantum computing applications S Gupta, A Rathi, B Parvais, A Dixit Solid-State Electronics 185, 108089, 2021 | 12 | 2021 |
| Large signal RF reliability of 45-nm RFSOI power amplifier cell for Wi-Fi6 applications A Rathi, P Srinivasan, F Guarin, A Dixit 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 11 | 2021 |
| RF reliability of CMOS-based power amplifier cell for 5G mmWave applications A Rathi, A Dixit, P Srinivasan, OH Gonzalez, F Guarin 2022 IEEE International Reliability Physics Symposium (IRPS), 4B. 3-1-4B. 3-6, 2022 | 4 | 2022 |
| Impact of hot carrier degradation on DC and RF performance of 45-nm power amplifier cell A Rathi, P Srinivasan, F Guarin, A Dixit 2021 IEEE Latin America Electron Devices Conference (LAEDC), 1-4, 2021 | 4 | 2021 |
| Characterization and analysis of hot carrier degradation under DC and large-signal RF stress in a PDSOI floating-body NFET-based power amplifier cell under WiFi operating … A Rathi, P Srinivasan, F Guarin, A Dixit IEEE Transactions on Device and Materials Reliability 22 (2), 232-238, 2022 | 3 | 2022 |
| Superior mm-Wave Large Signal Power Amplifier Reliability of p-Type FET in a 45-nm Partially-Depleted Silicon-On-Insulator RF Technology A Rathi, P Srinivasan, F Guarin, A Dixit IEEE Electron Device Letters 43 (5), 797-800, 2022 | 3 | 2022 |
| Investigation of temperature dependence of mmWave power amplifier large-signal reliability performance A Rathi, P Srinivasan, F Guarin, A Dixit IEEE Transactions on Electron Devices 70 (3), 928-933, 2023 | 2 | 2023 |
| Deep cryogenic temperature TDDB in 45-nm PDSOI N-channel FETs for quantum computing applications A Amin, A Rathi, SK Singh, A Dixit, OH Gonzalez, P Srinivasan, F Guarin 2022 IEEE International Reliability Physics Symposium (IRPS), 11A. 5-1-11A. 5-6, 2022 | 2 | 2022 |
| Impact of RF Frequency Bands on the DC and Large Signal Reliability of a 45nm RFSOI NFET based Power Amplifier Cell A Rathi, P Srinivasan, A Dixit 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | 1 | 2023 |
| Heavy-Ion Induced Single Event Transients in Sub-7nm Bulk and SOI NSFETs CK Jha, A Rathi, P Yogi, K Aditya, A Dixit 2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020 | 1 | 2020 |
| Modeling of RF Bulk and SOI Planar MOSFETs using Industry Standard BSIM Models A Rathi, M Kumar, JK Verma, HS Jatana, YS Chauhan, A Dixit 2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020 | 1 | 2020 |
| Impact of gate oxide thickness on flicker noise (1/f) in PDSOI n-channel FETs S Pathak, S Gupta, A Rathi, P Srinivasan, A Dixit Solid-State Electronics, 108935, 2024 | | 2024 |
| Temperature Dependent Study of Large-Signal Reliability of p-FET Based Power Amplifier for mmWave Applications A Rathi, P Srinivasan, F Guarin, A Dixit IEEE Transactions on Device and Materials Reliability, 2023 | | 2023 |
| Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications A Rathi, A Dixit, N Satish, P Srinivasan, F Guarin 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | | 2023 |
Abhisek DixitNXP Chair Professor, Electrical Engineering, IIT Delhi, New Delhi, IndiaVerified email at ee.iitd.ac.in
