| Studies of multiwall carbon nanotubes using Raman spectroscopy and atomic force microscopy M Zdrojek, W Gebicki, C Jastrzebski, T Melin, A Huczko Solid State Phenomena 99, 265-268, 2004 | 118 | 2004 |
| Electric force microscopy of individually charged nanoparticles on conductors: An analytical model for quantitative charge imaging T Mélin, H Diesinger, D Deresmes, D Stiévenard Physical Review B 69 (3), 035321, 2004 | 112 | 2004 |
| Surface potential of n-and p-type GaN measured by Kelvin force microscopy S Barbet, R Aubry, MA di Forte-Poisson, JC Jacquet, D Deresmes, T Melin, ... Applied Physics Letters 93 (21), 2008 | 90 | 2008 |
| Charge injection in individual silicon nanoparticles deposited on a conductive substrate T Melin, D Deresmes, D Stiévenard Applied physics letters 81 (26), 5054-5056, 2002 | 77 | 2002 |
| Charging and discharging processes of carbon nanotubes probed by electrostatic force microscopy M Zdrojek, T Melin, H Diesinger, D Stiévenard, W Gebicki, L Adamowicz Journal of applied physics 100 (11), 2006 | 73 | 2006 |
| Probing nanoscale dipole-dipole interactions by electric force microscopy T Melin, H Diesinger, D Deresmes, D Stiévenard Physical review letters 92 (16), 166101, 2004 | 72 | 2004 |
| High-resolution kelvin probe force microscopy imaging of interface dipoles and photogenerated charges in organic donor–acceptor photovoltaic blends F Fuchs, F Caffy, R Demadrille, T Mélin, B Grévin ACS nano 10 (1), 739-746, 2016 | 65 | 2016 |
| Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy E Palleau, L Ressier, T Mélin Nanotechnology 21 (22), 225706, 2010 | 61 | 2010 |
| Cross-talk artefacts in Kelvin probe force microscopy imaging: a comprehensive study S Barbet, M Popoff, H Diesinger, D Deresmes, D Theron, T Melin Journal of Applied Physics 115 (14), 2014 | 59 | 2014 |
| Thermally assisted formation of silicon islands on a silicon-on-insulator substrate B Legrand, V Agache, T Melin, JP Nys, V Senez, D Stiévenard Journal of applied physics 91 (1), 106-111, 2002 | 49 | 2002 |
| Exciton formation and relaxation dynamics in quantum wires R Kumar, AS Vengurlekar, AV Gopal, T Mélin, F Laruelle, B Etienne, ... Physical review letters 81 (12), 2578, 1998 | 43 | 1998 |
| Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy M Zdrojek, T Melin, C Boyaval, D Stiévenard, B Jouault, M Wozniak, ... Applied Physics Letters 86 (21), 2005 | 41 | 2005 |
| Localization and delocalization of charges injected in DNA T Heim, T Melin, D Deresmes, D Vuillaume Applied physics letters 85 (13), 2637-2639, 2004 | 39 | 2004 |
| Dispersive charge transport along the surface of an insulating layer observed by electrostatic force microscopy J Lambert, G de Loubens, C Guthmann, M Saint-Jean, T Mélin Physical Review B 71 (15), 155418, 2005 | 38 | 2005 |
| Electric charge enhancements in carbon nanotubes: theory and experiments Z Wang, M Zdrojek, T Mélin, M Devel Physical Review B 78 (8), 085425, 2008 | 37 | 2008 |
| Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy T Melin, S Barbet, H Diesinger, D Théron, D Deresmes Review of scientific instruments 82 (3), 2011 | 35 | 2011 |
| Electrostatic force microscopy and Kelvin force microscopy as a probe of the electrostatic and electronic properties of carbon nanotubes T Mélin, M Zdrojek, D Brunel Scanning probe microscopy in nanoscience and nanotechnology, 89-128, 2010 | 35 | 2010 |
| Kelvin force microscopy at the second cantilever resonance: An out-of-vacuum crosstalk compensation setup H Diesinger, D Deresmes, JP Nys, T Melin Ultramicroscopy 108 (8), 773-781, 2008 | 31 | 2008 |
| Inner-shell charging of multiwalled carbon nanotubes M Zdrojek, T Heim, D Brunel, A Mayer, T Melin Physical Review B 77 (3), 033404, 2008 | 30 | 2008 |
| Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin force microscopy D Brunel, D Deresmes, T Mélin Applied Physics Letters 94 (22), 2009 | 28 | 2009 |
