‪F. Alvarez (https://orcid.org/0000-0002-9393-1298)‬

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Carlos Alejandro FigueroaFull Professor at the Universidade de Caxias do SulE-mail confirmado em ucs.br
A.R. ZanattaBrazilE-mail confirmado em ifsc.usp.br
Roosevelt Droppa Jr.Professor associado, Universidade Federal do ABCE-mail confirmado em ufabc.edu.br
maria cristina dos santosuniversidade de são pauloE-mail confirmado em if.usp.br
Luiz Fernando ZagonelUniversidade Estadual de CampinasE-mail confirmado em ifi.unicamp.br
Rodrigo Gribel LacerdaProfessor of Physics, Universidade Federal de Minas GeraisE-mail confirmado em fisica.ufmg.br
Roberto KoropeckiIFIS-UNL-CONICET; ArgentinaE-mail confirmado em ifis.santafe-conicet.gov.ar
Rodrigo Leonardo de Oliveira BassoProfessor of Physics, Universidade Federal da Integração Latino-AmericanaE-mail confirmado em unila.edu.br
Fernando L Freire JrPontifical Catholic University of Rio de JaneiroE-mail confirmado em vdg.fis.puc-rio.br
Andre Santarosa FerlautoProfessor of Materials Engineering, Universidade Federal do ABCE-mail confirmado em ufabc.edu.br
Roberto ArceIFIS - Instituto de Física Santa Fe (CONICET - UNL)E-mail confirmado em ifis.santafe-conicet.gov.ar
Carlos RettoriUniversidade Federal do ABC; Universidade Estadual de Campinas, UNICAMPE-mail confirmado em ifi.unicamp.br
Ines PereyraProf. Engenharia Sistemas Eletrônicos, Escola Politecnica, Universidade de São PauloE-mail confirmado em lme.usp.br
Marcelo N.P. CarreñoUniversity of São Paulo (USP)E-mail confirmado em lme.usp.br
M. GanciuE-mail confirmado em inflpr.ro
Pedro Prieto PulidoProfesor Ciencia de materialesE-mail confirmado em correounivalle.edu.co
Lisandro Pavie CardosoProfessor Titular Aposentado do Instituto de Física Gleb Wataghin da Universidade Estadual deE-mail confirmado em ifi.unicamp.br

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F. Alvarez (https://orcid.org/0000-0002-9393-1298)

Full Professor, Instituto de Fisica, Unversidad de Campinas

E-mail confirmado em ifi.unicamp.br - Página inicial

Hard Coatings Electron Spectroscopy (XPS)Amorphous Semiconductors Nano-Structures Plasma Nitriding


Título Ordenar por citações Ordenar por ano Ordenar por título	Citado por Citado por	Ano
Electronic structure of nitrogen-carbon alloys (a− CN x) determined by photoelectron spectroscopy S Souto, M Pickholz, MC Dos Santos, F Alvarez Physical Review B 57 (4), 2536, 1998	266	1998
Surface and electronic structure of titanium dioxide photocatalysts SA Bilmes, P Mandelbaum, F Alvarez, NM Victoria The Journal of Physical Chemistry B 104 (42), 9851-9858, 2000	205	2000
Nitrogen substitution of carbon in graphite: Structure evolution toward molecular forms MC Dos Santos, F Alvarez Physical Review B 58 (20), 13918, 1998	192	1998
Electronic structure of hydrogenated carbon nitride films P Hammer, NM Victoria, F Alvarez Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (5 …, 1998	191	1998
Incorporation of nitrogen in carbon nanotubes R Droppa Jr, P Hammer, ACM Carvalho, MC Dos Santos, F Alvarez Journal of Non-Crystalline Solids 299, 874-879, 2002	140	2002
Influence of the process temperature on the steel microstructure and hardening in pulsed plasma nitriding LF Zagonel, CA Figueroa, R Droppa Jr, F Alvarez Surface and Coatings Technology 201 (1-2), 452-457, 2006	112	2006
Comprehensive spectroscopic study of nitrogenated carbon nanotubes R Droppa Jr, CTM Ribeiro, AR Zanatta, MC Dos Santos, F Alvarez Physical Review B 69 (4), 045405, 2004	98	2004
Influence of microstructure on the corrosion behavior of nitrocarburized AISI H13 tool steel obtained by pulsed DC plasma RLO Basso, RJ Candal, CA Figueroa, D Wisnivesky, F Alvarez Surface and Coatings Technology 203 (10-11), 1293-1297, 2009	87	2009
The role of hydrogen in nitrogen-containing diamondlike films studied by photoelectron spectroscopy S Souto, F Alvarez Applied physics letters 70 (12), 1539-1541, 1997	87	1997
Chemical (dis) order in a-Si 1− x C x: H for x< 0.6 PI Rovira, F Alvarez Physical Review B 55 (7), 4426, 1997	85	1997
Effects of increasing nitrogen concentration on the structure of carbon nitride films deposited by ion beam assisted deposition P Hammer, NM Victoria, F Alvarez Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 18 (5 …, 2000	72	2000
Infrared analysis of deuterated carbon–nitrogen films obtained by dual-ion-beam-assisted-deposition F Alvarez, NM Victoria, P Hammer, FL Freire Jr, MC Dos Santos Applied physics letters 73 (8), 1065-1067, 1998	72	1998
Nanosized precipitates in H13 tool steel low temperature plasma nitriding LF Zagonel, J Bettini, RLO Basso, P Paredez, H Pinto, CM Lepienski, ... Surface and Coatings Technology 207, 72-78, 2012	70	2012
Comparative study on the bonding structure of hydrogenated and hydrogen free carbon nitride films with high N content P Hammer, RG Lacerda, R Droppa Jr, F Alvarez Diamond and Related Materials 9 (3-6), 577-581, 2000	70	2000
The influence of different silicon adhesion interlayers on the tribological behavior of DLC thin films deposited on steel by EC-PECVD F Cemin, LT Bim, CM Menezes, MEHM da Costa, IJR Baumvol, F Alvarez, ... Surface and Coatings Technology 283, 115-121, 2015	67	2015
Morphological and magnetic properties of carbon–nickel nanocomposite thin films FC Fonseca, AS Ferlauto, F Alvarez, GF Goya, RF Jardim Journal of Applied Physics 97 (4), 2005	63	2005
Influence of chemical sputtering on the composition and bonding structure of carbon nitride films P Hammer, F Alvarez Thin Solid Films 398, 116-123, 2001	63	2001
A simple method to determine the optical constants and thicknesses of ZnxCd1− xS thin films J Torres, JI Cisneros, G Gordillo, F Alvarez Thin Solid Films 289 (1-2), 238-241, 1996	62	1996
Hard graphitic-like amorphous carbon films with high stress and local microscopic density RG Lacerda, P Hammer, CM Lepienski, F Alvarez, FC Marques Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (3 …, 2001	61	2001
Time resolved photoluminescence of porous silicon: Evidence for tunneling limited recombination in a band of localized states LR Tessler, F Alvarez, O Teschke Applied physics letters 62 (19), 2381-2383, 1993	61	1993

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