| Determination of diffusion length for the finite thickness normal-collector configuration using EBIC technique CC Tan, VKS Ong, K Radhakrishnan, SHB Sunar IEEE transactions on electron devices 60 (10), 3541-3547, 2013 | 7 | 2013 |
| The study of the charge collection of the normal‐collector configuration CC Tan, VKS Ong, K Radhakrishnan Progress in Photovoltaics: Research and Applications 21 (5), 986-995, 2013 | 5 | 2013 |
| Investigation on the direct method for the extraction of semiconductor material parameters using the EBIC line scan: Planar-collector configuration CC Tan, VKS Ong, K Radhakrishnan IEEE transactions on electron devices 60 (7), 2346-2352, 2013 | 5 | 2013 |
| TCAD studies on the determination of diffusion length for the planar-collector EBIC configuration with any size of the Schottky contact CC Tan, VKS Ong, K Radhakrishnan IEEE Transactions on Electron Devices 62 (9), 3100-3103, 2015 | 4 | 2015 |
| An analytical expression for charge collection probability from within a U-shaped junction well CC Tan, VKS Ong IEEE transactions on electron devices 57 (11), 3068-3073, 2010 | 4 | 2010 |
| A direct method for charge collection probability computation using the reciprocity theorem O Kurniawan, CC Tan, VKS Ong, E Li, CJ Humphreys IEEE transactions on electron devices 57 (10), 2455-2461, 2010 | 3 | 2010 |
| Improved calculation of charge collection probability from within the junction well VKS Ong, CC Tan, O Kurniawan, K Radhakrishnan IEEE transactions on electron devices 58 (12), 4434-4437, 2011 | 1 | 2011 |
| The detection of electron-beam-induced current in junctionless semiconductor CC Tan, VKS Ong Review of Scientific Instruments 81 (6), 2010 | 1 | 2010 |
| Computation of charge collection probability for any collecting junction shape O Kurniawan, VKS Ong, CC Tan, E Li Proceedings of the 2009 12th International Symposium on Integrated Circuits …, 2009 | 1 | 2009 |
| Charge collection probability: Normal-collector configuration CC Tan, VKS Ong, K Radhakrishnan 2011 International Symposium on Integrated Circuits, 516-519, 2011 | | 2011 |
| Charge Collection From Within a Collecting Junction Well (vol 55, pg 1220, 2008) O Kurniawan, CC Tan, VKS Ong IEEE TRANSACTIONS ON ELECTRON DEVICES 57 (9), 2358-2358, 2010 | | 2010 |
| Corrections to “Charge Collection From Within a Collecting Junction Well”[May 08 1220-1228] O Kurniawan, CC Tan, VKS Ong IEEE Transactions on Electron Devices 57 (9), 2358-2358, 2010 | | 2010 |
| COMMENTS AND CORRECTIONS Errata for" Charge Collection From Within a Collecting Junction Well" O Kurniawan, CC Tan, VKS Ong IEEE Transactions on Electron Devices 57 (9), 2358, 2010 | | 2010 |
| Extraction of diffusion length using junction-less EBIC VKS Ong, CC Tan, K Radhakrishnan Proceedings of the 2009 12th International Symposium on Integrated Circuits …, 2009 | | 2009 |
| Computation of charge collection probability for any collecting junction shape VKS Ong, CC Tan, O Kurniawan, E Li | | 2009 |
