| Composition mapping in InGaN by scanning transmission electron microscopy A Rosenauer, T Mehrtens, K Müller, K Gries, M Schowalter, PV Satyam, ... Ultramicroscopy 111 (8), 1316-1327, 2011 | 185 | 2011 |
| Effects of instrument imperfections on quantitative scanning transmission electron microscopy FF Krause, M Schowalter, T Grieb, K Müller-Caspary, T Mehrtens, ... Ultramicroscopy 161, 146-160, 2016 | 60 | 2016 |
| Structural and optical properties of InAs/(In) GaAs/GaAs quantum dots with single-photon emission in the telecom C-band up to 77 K C Carmesin, F Olbrich, T Mehrtens, M Florian, S Michael, S Schreier, ... Physical Review B 98 (12), 125407, 2018 | 54 | 2018 |
| Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction C Mahr, K Müller-Caspary, T Grieb, M Schowalter, T Mehrtens, FF Krause, ... Ultramicroscopy 158, 38-48, 2015 | 53 | 2015 |
| Nanoscopic insights into InGaN/GaN core–shell nanorods: structure, composition, and luminescence M Müller, P Veit, FF Krause, T Schimpke, S Metzner, F Bertram, ... Nano letters 16 (9), 5340-5346, 2016 | 50 | 2016 |
| Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography T Mehrtens, M Schowalter, D Tytko, P Choi, D Raabe, L Hoffmann, ... Applied Physics Letters 102 (13), 2013 | 46 | 2013 |
| Formation of InP nanomembranes and nanowires under fast anodic etching of bulk substrates E Monaico, I Tiginyanu, O Volciuc, T Mehrtens, A Rosenauer, J Gutowski, ... Electrochemistry Communications 47, 29-32, 2014 | 37 | 2014 |
| Materials characterisation by angle-resolved scanning transmission electron microscopy K Müller-Caspary, O Oppermann, T Grieb, FF Krause, A Rosenauer, ... Scientific reports 6 (1), 37146, 2016 | 36 | 2016 |
| Quantitative measurements of internal electric fields with differential phase contrast microscopy on InGaN/GaN quantum well structures M Lohr, R Schregle, M Jetter, C Wächter, K Müller‐Caspary, T Mehrtens, ... physica status solidi (b) 253 (1), 140-144, 2016 | 34 | 2016 |
| Conventional transmission electron microscopy imaging beyond the diffraction and information limits A Rosenauer, FF Krause, K Müller, M Schowalter, T Mehrtens Physical review letters 113 (9), 096101, 2014 | 31 | 2014 |
| Optimization of the preparation of GaN-based specimens with low-energy ion milling for (S) TEM T Mehrtens, S Bley, PV Satyam, A Rosenauer Micron 43 (8), 902-909, 2012 | 31 | 2012 |
| Direct measurement of polarization-induced fields in GaN/AlN by nano-beam electron diffraction D Carvalho, K Müller-Caspary, M Schowalter, T Grieb, T Mehrtens, ... Scientific reports 6 (1), 28459, 2016 | 29 | 2016 |
| Reconstruction of nuclear quadrupole interaction in (In, Ga) As/GaAs quantum dots observed by transmission electron microscopy PS Sokolov, MY Petrov, T Mehrtens, K Müller-Caspary, A Rosenauer, ... Physical Review B 93 (4), 045301, 2016 | 26 | 2016 |
| Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images T Mehrtens, K Müller, M Schowalter, D Hu, DM Schaadt, A Rosenauer Ultramicroscopy 131, 1-9, 2013 | 24 | 2013 |
| Atomic scale investigations of ultra-thin GaInN/GaN quantum wells with high indium content L Hoffmann, H Bremers, H Jönen, U Rossow, M Schowalter, T Mehrtens, ... Applied Physics Letters 102 (10), 2013 | 24 | 2013 |
| Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence T Grieb, FF Krause, M Schowalter, D Zillmann, R Sellin, K Müller-Caspary, ... Ultramicroscopy 190, 45-57, 2018 | 21 | 2018 |
| Structural and emission properties of InGaAs/GaAs quantum dots emitting at 1.3 μm E Goldmann, M Paul, FF Krause, K Müller, J Kettler, T Mehrtens, ... Applied Physics Letters 105 (15), 2014 | 21 | 2014 |
| Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation T Grieb, M Tewes, M Schowalter, K Müller-Caspary, FF Krause, ... Ultramicroscopy 184, 29-36, 2018 | 19 | 2018 |
| Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaN FF Krause, D Bredemeier, M Schowalter, T Mehrtens, T Grieb, ... Ultramicroscopy 189, 124-135, 2018 | 17 | 2018 |
| Homogeneity and composition of AlInGaN: A multiprobe nanostructure study FF Krause, JP Ahl, D Tytko, PP Choi, R Egoavil, M Schowalter, ... Ultramicroscopy 156, 29-36, 2015 | 16 | 2015 |
