| Multiple cell upset classification in commercial SRAMs G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Todri, ... IEEE Transactions on Nuclear Science 61 (4), 1747-1754, 2014 | 68 | 2014 |
| Radiation effects on deep submicrometer SRAM-based FPGAs under the CERN mixed-field radiation environment G Tsiligiannis, S Danzeca, RG Alía, A Infantino, A Lesea, M Brugger, ... IEEE Transactions on Nuclear Science 65 (8), 1511-1518, 2018 | 52 | 2018 |
| Testing a commercial MRAM under neutron and alpha radiation in dynamic mode G Tsiligiannis, L Dilillo, A Bosio, P Girard, A Todri, A Virazel, SS McClure, ... IEEE Transactions on Nuclear Science 60 (4), 2617-2622, 2013 | 49 | 2013 |
| Dynamic test methods for COTS SRAMs G Tsiligiannis, L Dilillo, V Gupta, A Bosio, P Girard, A Virazel, H Puchner, ... IEEE Transactions on Nuclear Science 61 (6), 3095-3102, 2014 | 38 | 2014 |
| Compositional translation of Simulink models into synchronous BIP V Sfyrla, G Tsiligiannis, I Safaka, M Bozga, J Sifakis International Symposium on Industrial Embedded System (SIES), 217-220, 2010 | 38 | 2010 |
| An SRAM based monitor for mixed-field radiation environments G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Todri, ... IEEE Transactions on Nuclear Science 61 (4), 1663-1670, 2014 | 23 | 2014 |
| Investigation on MCU clustering methodologies for cross-section estimation of RAMs A Bosser, V Gupta, G Tsiligiannis, A Javanainen, H Kettunen, H Puchner, ... IEEE Transactions on Nuclear Science 62 (6), 2620-2626, 2015 | 21 | 2015 |
| Investigating the impact of radiation-induced soft errors on the reliability of approximate computing systems LM Luza, D Söderström, G Tsiligiannis, H Puchner, C Cazzaniga, ... 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 20 | 2020 |
| Single-event effects in the peripheral circuitry of a commercial ferroelectric random access memory AL Bosser, V Gupta, A Javanainen, G Tsiligiannis, SD LaLumondiere, ... IEEE Transactions on Nuclear Science 65 (8), 1708-1714, 2018 | 15 | 2018 |
| Heavy-ion radiation impact on a 4Mb FRAM under different test conditions V Gupta, A Bosser, G Tsiligiannis, A Zadeh, A Javanainen, A Virtanen, ... 2015 15th European Conference on Radiation and Its Effects on Components and …, 2015 | 13 | 2015 |
| SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations G Tsiligiannis, EI Vătăjelu, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, ... 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 145-150, 2013 | 13 | 2013 |
| Evaluation of test algorithms stress effect on SRAMs under neutron radiation G Tsiligiannis, L Dilillo, A Bosio, P Girard, A Todri, A Virazel, AD Touboul, ... 2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 121-122, 2012 | 13 | 2012 |
| Methodologies for the statistical analysis of memory response to radiation AL Bosser, V Gupta, G Tsiligiannis, CD Frost, A Zadeh, J Jaatinen, ... IEEE Transactions on Nuclear Science 63 (4), 2122-2128, 2016 | 12 | 2016 |
| On the correlation between static noise margin and soft error rate evaluated for a 40nm SRAM cell EI Vătăjelu, G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, ... 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2013 | 12 | 2013 |
| Mechanisms of electron-induced single-event upsets in medical and experimental linacs M Tali, RG Alía, M Brugger, V Ferlet-Cavrois, R Corsini, W Farabolini, ... IEEE Transactions on Nuclear Science 65 (8), 1715-1723, 2018 | 11 | 2018 |
| Soft errors in commercial off-the-shelf static random access memories L Dilillo, G Tsiligiannis, V Gupta, A Bosser, F Saigné, F Wrobel Semiconductor Science and Technology 32 (1), 013006, 2016 | 11 | 2016 |
| Heavy-ion radiation impact on a 4 mb fram under different test modes and conditions V Gupta, A Bosser, G Tsiligiannis, A Zadeh, A Javanainen, A Virtanen, ... IEEE Transactions on Nuclear Science 63 (4), 2010-2015, 2016 | 11 | 2016 |
| Investigation on the sensitivity of a 65nm Flash-based FPGA for CERN applications G Tsiligiannis, R Ferraro, S Danzeca, A Masi, M Brugger, F Saigné 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 8 | 2016 |
| Evaluation and analysis of technologies for robotic platforms for the nuclear decommissioning G Tsiligiannis, A Touboul, G Bricas, T Maraine, J Boch, F Wrobel, ... 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 1-6, 2020 | 7 | 2020 |
| SEE on different layers of stacked-SRAMs V Gupta, A Bosser, G Tsiligiannis, M Rousselet, A Mohammadzadeh, ... IEEE Transactions on Nuclear Science 62 (6), 2673-2678, 2015 | 7 | 2015 |
