Sule Ozev
Title
Cited by
Cited by
Year
Testing of Droplet-Based Microelectrofluidic Systems.
F Su, S Ozev, K Chakrabarty
ITC 46, 1192-1200, 2003
1472003
A mechanism for online diagnosis of hard faults in microprocessors
FA Bower, DJ Sorin, S Ozev
38th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO'05 …, 2005
1382005
Tolerating hard faults in microprocessor array structures
FA Bower, PG Shealy, S Ozev, DJ Sorin
International Conference on Dependable Systems and Networks, 2004, 51-60, 2004
1232004
Ensuring the operational health of droplet-based microelectrofluidic biosensor systems
F Su, S Ozev, K Chakrabarty
IEEE Sensors Journal 5 (4), 763-773, 2005
942005
Defect filter for alternate RF test
HG Stratigopoulos, S Mir, E Acar, S Ozev
2010 15th IEEE European Test Symposium, 265-270, 2010
932010
Test planning and test resource optimization for droplet-based microfluidic systems
F Su, S Ozev, K Chakrabarty
Journal of Electronic Testing 22 (2), 199-210, 2006
832006
Concurrent testing of droplet-based microfluidic systems for multiplexed biomedical assays
F Su, S Ozev, K Chakrabarty
2004 International Conferce on Test, 883-892, 2004
682004
Detailed characterization of transceiver parameters through loop-back-based BiST
ES Erdogan, S Ozev
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (6), 901-911, 2009
582009
Concurrent testing of digital microfluidics-based biochips
F Su, S Ozev, K Chakrabarty
ACM Transactions on Design Automation of Electronic Systems (TODAES) 11 (2 …, 2006
542006
Statistical test development for analog circuits under high process variations
F Liu, S Ozev
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007
492007
Wafer-level RF test and DfT for VCO modulating transceiver architectures
S Ozev, C Olgaard
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 217-222, 2004
422004
Testability implications in low-cost integrated radio transceivers: a Bluetooth case study
S Ozev, C Gaard, A Orailoglu
Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 965-974, 2001
402001
Self-repairing of microprocessor array structures
FA Bower III, S Ozev, PG Shealy, DJ Sorin
US Patent 7,415,644, 2008
382008
Online diagnosis of hard faults in microprocessors
FA Bower, DJ Sorin, S Ozev
ACM Transactions on Architecture and Code Optimization (TACO) 4 (2), 8-es, 2007
352007
An ADC-BiST scheme using sequential code analysis
ES Erdogan, S Ozev
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007
342007
Defect-based RF testing using a new catastrophic fault model
E Acar, S Ozev
IEEE International Conference on Test, 2005., 9 pp.-429, 2005
342005
Defect-oriented testing of RF circuits
E Acar, S Ozev
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
332008
Adaptive test elimination for analog/RF circuits
E Yilmaz, S Ozev
2009 46th ACM/IEEE Design Automation Conference, 720-725, 2009
302009
Test infrastructure design for mixed-signal SOCs with wrapped analog cores
A Sehgal, S Ozev, K Chakrabarty
IEEE Transactions on very large scale integration (VLSI) systems 14 (3), 292-304, 2006
302006
Adaptive test flow for mixed-signal/RF circuits using learned information from device under test
E Yilmaz, S Ozev, KM Butler
2010 IEEE International Test Conference, 1-10, 2010
292010
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