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Takashi Sato
Takashi Sato
Kyoto University
E-mail confirmado em ieee.org
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New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation
Y Cao, T Sato, M Orshansky, D Sylvester, C Hu
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No …, 2000
7042000
Semiconductor integrated circuit
S Matsui, T Sato, K Sakata, T Yaguchi, K Kuwabara, A Nakamura, ...
US Patent 7,412,616, 2008
1302008
Predictive technology model
YU Cao, T Sato, D Sylvester, M Orshansky, C Hu
Internet: http://ptm. asu. edu, 2002
1152002
Data transmitter
T Sato, Y Nishio, Y Nakagome
US Patent 6,359,815, 2002
902002
Compact modeling of statistical BTI under trapping/detrapping
JB Velamala, KB Sutaria, H Shimizu, H Awano, T Sato, G Wirth, Y Cao
IEEE Transactions on Electron Devices 60 (11), 3645-3654, 2013
772013
Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis
K Katayama, S Hagiwara, H Tsutsui, H Ochi, T Sato
2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 703-708, 2010
742010
Physics matters: statistical aging prediction under trapping/detrapping
JB Velamala, K Sutaria, T Sato, Y Cao
Proceedings of the 49th Annual Design Automation Conference, 139-144, 2012
632012
On-chip thermal gradient analysis and temperature flattening for SoC design
T Sato, J Ichimiya, N Ono, K Hachiya, M Hashimoto
IEICE Transactions on Fundamentals of Electronics, Communications and …, 2005
622005
Aging statistics based on trapping/detrapping: Silicon evidence, modeling and long-term prediction
JB Velamala, KB Sutaria, T Sato, Y Cao
2012 IEEE International Reliability Physics Symposium (IRPS), 2F. 2.1-2F. 2.5, 2012
552012
Modeling the overshooting effect for CMOS inverter delay analysis in nanometer technologies
Z Huang, A Kurokawa, M Hashimoto, T Sato, M Jiang, Y Inoue
IEEE transactions on computer-aided design of integrated circuits and …, 2010
532010
Circuit design for reliability
R Reis, Y Cao, G Wirth
Springer New York, 2015
482015
Efficient generation of delay change curves for noise-aware static timing analysis
K Agarwal, Y Cao, T Sato, D Sylvester, C Hu
Proceedings of the 2002 Asia and South Pacific Design Automation Conference, 77, 2002
422002
Validation of a full-chip simulation model for supply noise and delay dependence on average voltage drop with on-chip delay measurement
Y Ogasahara, T Enami, M Hashimoto, T Sato, T Onoye
IEEE Transactions on Circuits and Systems II: Express Briefs 54 (10), 868-872, 2007
392007
Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves
T Sato, Y Cao, K Agarwal, D Sylvester, C Hu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2003
362003
Accurate in situ measurement of peak noise and delay change induced by interconnect coupling
T Sato, D Sylvester, Y Cao, C Hu
IEEE Journal of Solid-State Circuits 36 (10), 1587-1591, 2001
362001
PARHELIA: Particle filter-based heart rate estimation from photoplethysmographic signals during physical exercise
Y Fujita, M Hiromoto, T Sato
IEEE Transactions on Biomedical Engineering 65 (1), 189-198, 2017
342017
Timing analysis considering temporal supply voltage fluctuation
M Hashimoto, J Yamaguchi, T Sato, H Onodera
IEICE TRANSACTIONS on Information and Systems 91 (3), 655-660, 2008
342008
A device array for efficient bias-temperature instability measurements
T Sato, T Kozaki, T Uezono, H Tsutsui, H Ochi
2011 Proceedings of the European Solid-State Device Research Conference …, 2011
322011
Characterization of interconnect coupling noise using in-situ delay-change curve measurements
T Sato, Y Cao, D Sylvester, C Hu
Proceedings of 13th Annual IEEE International ASIC/SOC Conference (Cat. No …, 2000
312000
Aging statistics based on trapping/detrapping: Compact modeling and silicon validation
KB Sutaria, JB Velamala, CH Kim, T Sato, Y Cao
IEEE Transactions on Device and Materials Reliability 14 (2), 607-615, 2014
272014
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