| Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si: H photovoltaics LR Dahal, D Sainju, NJ Podraza, S Marsillac, RW Collins Thin Solid Films 519 (9), 2682-2687, 2011 | 50 | 2011 |
| High-speed imaging/mapping spectroscopic ellipsometry for in-line analysis of roll-to-roll thin-film photovoltaics A Shan, M Fried, G Juhász, C Major, O Polgár, Á Németh, P Petrik, ... IEEE journal of Photovoltaics 4 (1), 355-361, 2013 | 39 | 2013 |
| Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology LR Dahal, J Li, JA Stoke, Z Huang, A Shan, AS Ferlauto, CR Wronski, ... Solar energy materials and solar cells 129, 32-56, 2014 | 25 | 2014 |
| Correlations between mapping spectroscopic ellipsometry results and solar cell performance for evaluations of nonuniformity in thin-film silicon photovoltaics LR Dahal, Z Huang, D Attygalle, C Salupo, S Marsillac, NJ Podraza, ... IEEE Journal of Photovoltaics 3 (1), 387-393, 2012 | 20 | 2012 |
| Quantum efficiency simulations from on-line compatible mapping of thin-film solar cells P Aryal, J Chen, Z Huang, LR Dahal, MN Sestak, D Attygalle, R Jacobs, ... 2011 37th IEEE Photovoltaic Specialists Conference, 002241-002246, 2011 | 18 | 2011 |
| Optical mapping of large area thin film solar cells Z Huang, J Chen, MN Sestak, D Attygalle, LR Dahal, MR Mapes, ... 2010 35th IEEE Photovoltaic Specialists Conference, 001678-001683, 2010 | 11 | 2010 |
| Optimization of Si: H multijunction nip solar cells through the development of deposition phase diagrams JA Stoke, LR Dahal, J Li, NJ Podraza, X Cao, X Deng, RW Collins 2008 33rd IEEE Photovoltaic Specialists Conference, 1-6, 2008 | 11 | 2008 |
| Application of real time spectroscopic ellipsometry for analysis of roll-to-roll fabrication of Si: H solar cells on polymer substrates LR Dahal, Z Huang, D Attygalle, MN Sestak, C Salupo, S Marsillac, ... 2010 35th IEEE Photovoltaic Specialists Conference, 000631-000636, 2010 | 10 | 2010 |
| Plasmonic characteristics of Ag/ZnO back-reflectors for thin film Si photovoltaics LR Dahal, D Sainju, J Li, JA Stoke, NJ Podraza, X Deng, RW Collins 2008 33rd IEEE Photovoltaic Specialists Conference, 1-6, 2008 | 10 | 2008 |
| Characterization of structure and growth evolution for nc-Si: H in the tandem photovoltaic device configuration Z Huang, LR Dahal, MM Junda, P Aryal, S Marsillac, RW Collins, ... IEEE Journal of Photovoltaics 5 (6), 1516-1522, 2015 | 7 | 2015 |
| Comparison of Al/ZnO and Ag/ZnO interfaces of back-reflectors for thin film Si∶ H photovoltaics LR Dahal, D Sainju, J Li, NJ Podraza, MN Sestak, RW Collins 2009 34th IEEE Photovoltaic Specialists Conference (PVSC), 001702-001707, 2009 | 7 | 2009 |
| Optimization of a-Si: H pin solar cells through development of n-layer growth evolution diagram and large area mapping Z Huang, LR Dahal, C Salupo, AS Ferlauto, NJ Podraza, RW Collins 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 1788-1793, 2013 | 6 | 2013 |
| Application of a dual-spectral-range, divergent-beam spectroscopic ellipsometer for high-speed mapping of large-area, laterally-inhomogeneous, photovoltaic multilayers M Fried, G Juhasz, C Major, A Nemeth, P Petrik, O Polgar, C Salupo, ... MRS Online Proceedings Library (OPL) 1323, mrss11-1323-c03-12, 2011 | 6 | 2011 |
| Through-the-glass spectroscopic ellipsometry of superstrate solar cells and large area panels J Chen, P Aryal, J Li, MN Sestak, LR Dahal, Z Huang, RW Collins 2011 37th IEEE Photovoltaic Specialists Conference, 003486-003491, 2011 | 5 | 2011 |
| Spectroscopic Ellipsometry Studies of Thin Film a-Si:H Solar Cell Fabrication by Multichamber Deposition in the n-i-p Substrate Configuration LR Dahal The University of Toledo, 2013 | 4 | 2013 |
| Optical metrology of thin film solar cells from 0.2 to 30 µm D Attygalle, Z Huang, P Koirala, P Aryal, MN Sestak, LR Dahal, ... 2010 35th IEEE Photovoltaic Specialists Conference, 001684-001688, 2010 | 4 | 2010 |
| 33rd IEEE Photovoltaic Specialists Conference, 2008 LR Dahal, D Sainju, J Li, JA Stoke, N Podraza, X Deng, RW Collins doi 10, 1-6, 2008 | 4 | 2008 |
| Real time and mapping spectroscopic ellipsometry of hydrogenated amorphous and nanocrystalline Si solar cells Z Huang, LR Dahal, S Marsillac, NJ Podraza, RW Collins Spectroscopic Ellipsometry for Photovoltaics: Volume 2: Applications and …, 2018 | 3 | 2018 |
| Ex situ analysis of multijunction solar cells based on hydrogenated amorphous silicon Z Huang, LR Dahal, P Koirala, W Du, S Cao, X Deng, NJ Podraza, ... Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental …, 2018 | 3 | 2018 |
| Single wall carbon nanotube electrodes for hydrogenated amorphous silicon solar cells RR Khanal, AB Philips, Z Huang, LR Dahal, NJ Podraza, RW Collins, ... 2012 38th IEEE Photovoltaic Specialists Conference, 000057-000061, 2012 | 3 | 2012 |
