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Heather Quinn
Heather Quinn
E-mail confirmado em lanl.gov
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The SuperCam instrument suite on the NASA Mars 2020 rover: Body unit and combined system tests
RC Wiens, S Maurice, SH Robinson, AE Nelson, P Cais, P Bernardi, ...
Space Science Reviews 217, 1-87, 2021
2302021
Radiation-induced multi-bit upsets in SRAM-based FPGAs
H Quinn, P Graham, J Krone, M Caffrey, S Rezgui
IEEE Transactions on Nuclear Science 52 (6), 2455-2461, 2005
2082005
SRAM FPGA reliability analysis for harsh radiation environments
PS Ostler, MP Caffrey, DS Gibelyou, PS Graham, KS Morgan, BH Pratt, ...
IEEE transactions on Nuclear Science 56 (6), 3519-3526, 2009
1702009
Domain crossing errors: Limitations on single device triple-modular redundancy circuits in Xilinx FPGAs
H Quinn, K Morgan, P Graham, J Krone, M Caffrey, K Lundgreen
IEEE Transactions on Nuclear Science 54 (6), 2037-2043, 2007
1422007
Perseverance’s scanning habitable environments with Raman and luminescence for organics and chemicals (SHERLOC) investigation
R Bhartia, LW Beegle, L DeFlores, W Abbey, J Razzell Hollis, K Uckert, ...
Space Science Reviews 217 (4), 58, 2021
1362021
Fault simulation and emulation tools to augment radiation-hardness assurance testing
HM Quinn, DA Black, WH Robinson, SP Buchner
IEEE Transactions on Nuclear Science 60 (3), 2119-2142, 2013
1212013
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE transactions on nuclear science 62 (6), 2547-2554, 2015
1152015
A method and case study on identifying physically adjacent multiple-cell upsets using 28-nm, interleaved and SECDED-protected arrays
M Wirthlin, D Lee, G Swift, H Quinn
IEEE transactions on nuclear science 61 (6), 3080-3087, 2014
1122014
Challenges in testing complex systems
H Quinn
IEEE Transactions on Nuclear Science 61 (2), 766-786, 2014
992014
Static proton and heavy ion testing of the Xilinx Virtex-5 device
H Quinn, K Morgan, P Graham, J Krone, M Caffrey
2007 IEEE Radiation Effects Data Workshop, 177-184, 2007
822007
Terrestrial-based radiation upsets: a cautionary tale
H Quinn, P Graham
13th Annual IEEE Symposium on Field-Programmable Custom Computing Machines …, 2005
812005
Vision for cross-layer optimization to address the dual challenges of energy and reliability
A DeHon, HM Quinn, NP Carter
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
702010
Experimental and analytical study of xeon phi reliability
D Oliveira, L Pilla, N DeBardeleben, S Blanchard, H Quinn, I Koren, ...
Proceedings of the International Conference for High Performance Computing …, 2017
622017
Single-event effects in low-cost, low-power microprocessors
H Quinn, T Fairbanks, JL Tripp, G Duran, B Lopez
2014 IEEE Radiation Effects Data Workshop (REDW), 1-9, 2014
622014
Radiation effects in reconfigurable FPGAs
H Quinn
Semiconductor Science and Technology 32 (4), 044001, 2017
562017
Assessment of the impact of cosmic-ray-induced neutrons on hardware in the roadrunner supercomputer
SE Michalak, AJ DuBois, CB Storlie, HM Quinn, WN Rust, DH DuBois, ...
IEEE Transactions on Device and Materials Reliability 12 (2), 445-454, 2012
562012
A test methodology for determining space readiness of Xilinx SRAM-based FPGA devices and designs
HM Quinn, PS Graham, MJ Wirthlin, B Pratt, KS Morgan, MP Caffrey, ...
IEEE Transactions on Instrumentation and Measurement 58 (10), 3380-3395, 2009
522009
Modern GPUs radiation sensitivity evaluation and mitigation through duplication with comparison
DAG Oliveira, P Rech, HM Quinn, TD Fairbanks, L Monroe, SE Michalak, ...
IEEE Transactions on Nuclear Science 61 (6), 3115-3122, 2014
482014
Runtime assignment of reconfigurable hardware components for image processing pipelines
H Quinn, LAS King, M Leeser, W Meleis
11th Annual IEEE Symposium on Field-Programmable Custom Computing Machines …, 2003
462003
Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs
J Tonfat, FL Kastensmidt, P Rech, R Reis, HM Quinn
IEEE transactions on nuclear science 62 (6), 3080-3087, 2015
432015
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