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Haiquan ZhaoProfessor of School of Electrical Engineering, Southwest Jiaotong UniversityVerified email at home.swjtu.edu.cn
Rodrigo de LamarePUC-Rio & University of YorkVerified email at york.ac.uk
Lu LuSichuan UniversityVerified email at scu.edu.cn
Badong ChenProfessor of Xi'an Jiaotong University, Xi'an, ChinaVerified email at mail.xjtu.edu.cn
Hongsen HeSouthwest University of Science and TechnologyVerified email at ieee.org
Zongsheng ZhengSichuan UniversityVerified email at scu.edu.cn
Xiaomin Yang四川大学Verified email at scu.edu.cn
Yuriy ZakharovUniversity of YorkVerified email at york.ac.uk
Tao YuSouthwest Petroleum UniversityVerified email at swpu.edu.cn
Kai-Li YinQingdao University of Science and TechnologyVerified email at qust.edu.cn
Jacob BenestyINRS-EMT, Univ. of Quebec, CanadaVerified email at inrs.ca
Yingsong LiAnhui UniversityVerified email at hrbeu.edu.cn
Hongyang Chen(陈红阳), IEEE DLZhejiang Lab, ChinaVerified email at ieee.org
Zhigang LiuProfessor, Southwest Jiaotong UniversityVerified email at home.swjtu.edu.cn
Jianghui LiUniversity of Southampton, UKVerified email at soton.ac.uk
Long ShiSouthwestern University of Finance and EconomicsVerified email at swufe.edu.cn