Monitoring oxygen production on mass-selected iridium–tantalum oxide electrocatalysts YR Zheng, J Vernieres, Z Wang, K Zhang, D Hochfilzer, K Krempl, ...
Nature Energy 7 (1), 55-64, 2022
121 2022 Single atom detection from low contrast-to-noise ratio electron microscopy images J Fatermans, AJ den Dekker, K Müller-Caspary, I Lobato, CM O’Leary, ...
Physical review letters 121 (5), 056101, 2018
42 2018 Coupling charge and topological reconstructions at polar oxide interfaces TC van Thiel, W Brzezicki, C Autieri, JR Hortensius, D Afanasiev, ...
Physical Review Letters 127 (12), 127202, 2021
27 2021 The maximum a posteriori probability rule for atom column detection from HAADF STEM images J Fatermans, S Van Aert, AJ den Dekker
Ultramicroscopy 201, 81-91, 2019
22 2019 Atom column detection from simultaneously acquired ABF and ADF STEM images J Fatermans, AJ den Dekker, K Müller-Caspary, N Gauquelin, J Verbeeck, ...
Ultramicroscopy 219, 113046, 2020
19 2020 Co valence transformation in isopolar G Araizi-Kanoutas, J Geessinck, N Gauquelin, S Smit, XH Verbeek, ...
Physical Review Materials 4 (2), 026001, 2020
15 2020 Chapter Six - Atom column detection J Fatermans, A De Backer, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 177-214, 2021
3 2021 Chapter Two - Statistical parameter estimation theory: principles and simulation studies A De Backer, J Fatermans, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 29-72, 2021
3 * 2021 Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites J Fatermans, G Romolini, T Altantzis, J Hofkens, MBJ Roeffaers, S Bals, ...
Nanoscale 14 (26), 9323-9330, 2022
2 2022 Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images A De Backer, J Fatermans, J Arnold, S Van Aert
Advances in Imaging and Electron Physics 217, 145-175, 2021
1 * 2021 Chapter Four - Atom counting A De Backer, J Fatermans, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 91-144, 2021
1 * 2021 Atom column detection from STEM images using the maximum a posteriori probability rule J Fatermans, AJ den Dekker, CM O'Leary, PD Nellist, S Van Aert
Microscopy Conference (MC) 2019, 2019
1 2019 Detection of atomic columns from noisy STEM images J Fatermans, K Müller-Caspary, AJ den Dekker, S Van Aert
Microscopy Conference (MC) 2017, 2017
1 2017 Detecting atoms from low-dose STEM images J Fatermans, AJ den Dekker, K Müller-Caspary, N Gauquelin, J Verbeeck, ...
Imaging & Microscopy 23, 33-35, 2021
2021 Chapter One - Introduction A De Backer, J Fatermans, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 1-28, 2021
2021 Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability J Fatermans, A De Backer, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 215-242, 2021
2021 Chapter Eight - General conclusions and future perspectives A De Backer, J Fatermans, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 243-253, 2021
2021 Chapter Three - Efficient fitting algorithm A De Backer, J Fatermans, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 73-90, 2021
2021 Bayesian model selection for atom column detection from ABF-ADF STEM images J Fatermans, AJ den Dekker, N Gauquelin, J Verbeeck, S Van Aert
Virtual Early Career European Microscopy Congress (EMC) 2020, 2020
2020 Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM S Van Aert, A De Backer, A De wael, J Fatermans, E Arslan Irmak, ...
Virtual MRS Spring/Fall Meeting, 2020
2020 
Sandra Van AertEMAT, University of AntwerpE-mail confirmado em uantwerpen.be
