Renato Giacomini

Cited by

	All	Since 2019
Citations	453	187
h-index	10	7
i10-index	11	4

20002001200220032004200520062007200820092010201120122013201420152016201720182019202020212022202320244 2 1 2 3 10 16 10 18 30 14 40 35 24 36 19 31 29 38 35 41 13

Public access

View all

3 articles

5 articles

available

not available

Based on funding mandates

Co-authors

Rudolf Theoderich BühlerProfessor, Department of Electrical Engineering, Centro Universitário da FEIVerified email at fei.edu.br
Joao Antonio MartinoUniversity of Sao PauloVerified email at usp.br
Nilberto H. MedinaProfessor, Universidade de São PauloVerified email at if.usp.br
Roberto Baginski B. SantosPhysics Department, Centro Universitário FEIVerified email at fei.edu.br
Cleiton Fidelix PereiraProfessor de Engenharia Elétrica, Centro Universitário FEIVerified email at fei.edu.br
Arianne Soares do Nascimento PereiraISPGayaVerified email at ispgaya.pt
Luís Eduardo Seixas Jr (L.E.Seixas) ht...CTI, Centro de Tecnologia da Informação Renato ArcherVerified email at cti.gov.br
André Luiz PerinProfessor, Centro Universitário FEIVerified email at fei.edu.br
Paula Ghedini Der AgopianSão Paulo State UniversityVerified email at unesp.br
Denis FlandreICTEAM, EPL, Université catholique de Louvain (UCL)Verified email at uclouvain.be
Vitor AguiarIFUSPVerified email at usp.br
Nemitala AddedProfessor Doutor no Depto de Física Nuclear - IF - USPVerified email at if.usp.br
Aryan AfzalianUniversité catholique de LouvainVerified email at uclouvain.be
F.R.Palomoprofesor de Ingeniería Electrónica, Escuela Técnica Superior de Ingeniería, Universidad de SevillaVerified email at us.es
Saulo FincoSenior Technologist Researcher at CTI Renato Archer, a research institute of the Ministry of ScienceVerified email at cti.gov.br
Marcelo Antonio PavanelloFull Professor, Department of Electrical Engineering, Centro Universitário da FEIVerified email at fei.edu.br
Eduardo Luiz Augusto MacchioneUniversidade de São PauloVerified email at usp.br
Fernando Rodrigues AguirreMestrando, Universidade de São PauloVerified email at if.usp.br
Rodrigo T. DoriaCentro Universitário da FEIVerified email at fei.edu.br
C. ClaeysProfessor KU LeuvenVerified email at kuleuven.be

Renato Giacomini

FEI

Verified email at fei.edu.br - Homepage

SOI Electronic devices CMOS simulation modeling


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Modeling silicon on insulator MOS transistors with nonrectangular-gate layouts R Giacomini, JA Martino Journal of the Electrochemical Society 153 (3), G218, 2006	39	2006
Trapezoidal cross-sectional influence on FinFET threshold voltage and corner effects R Giacomini, JA Martino Journal of the Electrochemical Society 155 (4), H213, 2008	38	2008
Ionizing radiation hardness tests of GaN HEMTs for harsh environments ACV Bôas, MAA de Melo, RBB Santos, R Giacomini, NH Medina, ... Microelectronics Reliability 116, 114000, 2021	27	2021
Illuminated to dark ratio improvement in lateral SOI PIN photodiodes at high temperatures C Novo, R Giacomini, R Doria, A Afzalian, D Flandre Semiconductor Science and Technology 29 (7), 075008, 2014	27	2014
Trapezoidal SOI FinFET analog parameters' dependence on cross-section shape RT Bühler, R Giacomini, MA Pavanello, JA Martino Semiconductor science and technology 24 (11), 115017, 2009	22	2009
Ionizing radiation effects on a COTS low-cost RISC microcontroller FGH Leite, RBB Santos, NH Medina, VAP Aguiar, RC Giacomini, N Added, ... 2017 18th IEEE Latin American Test Symposium (LATS), 1-4, 2017	20	2017
Bio-Amplifier based on MOS bipolar Pseudo-Resistors: A New Approach using its non-linear characteristic PL Benko, M Galeti, CF Pereira, JC Lucchi, RC Giacomini Journal of Integrated Circuits and Systems 11 (2), 132-139, 2016	15	2016
Fin shape influence on the analog performance of standard and strained MuGFETs RT Bühler, JA Martino, PGD Agopian, R Giacomini, E Simoen, C Claeys 2010 IEEE International SOI Conference (SOI), 1-2, 2010	12	2010
Transitory recovery time of bio-potential amplifiers that include CMOS pseudo-resistors CF Pereira, PL Benko, JC Lucchi, RC Giacomini 2014 International Caribbean Conference on Devices, Circuits and Systems …, 2014	11	2014
Innovative approach for electrical characterisation of pseudo‐resistors PL Benko, M Galeti, CF Pereira, JC Lucchi, R Giacomini Electronics Letters 52 (25), 2031-2032, 2016	10	2016
Operation of lateral SOI PIN photodiodes with back-gate bias and intrinsic length variation C Novo, R Giacomini, A Afzalian, D Flandre ECS Transactions 53 (5), 121, 2013	10	2013
Teraohm pseudo-resistor experimental characterization aiming at implementation of bio-amplifiers CF Pereira, PL Benko, JC Lucchi, RC Giacomini 2016 31st Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2016	9	2016
Experimental study and modeling of pseudo-resistor's non-linearity CF Pereira, PL Benko, M Galeti, JC Lucchi, RC Giacomini 2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2017	8	2017
First successful SEE measurements with heavy ions in Brazil NH Medina, MAG Silveira, N Added, VAP Aguiar, R Giacomini, ... 2014 IEEE Radiation Effects Data Workshop (REDW), 1-3, 2014	8	2014
Sensing magnetic fields in any direction using FinFETs and L-gate FinFETs AL Perin, R Giacomini 2012 IEEE International SOI Conference (SOI), 1-2, 2012	8	2012
An analytical estimation model for the spreading resistance of Double-Gate FinFETs CT Malheiro, ASN Pereira, R Giacomini 2012 8th International Caribbean Conference on Devices, Circuits and Systems …, 2012	8	2012
Filter-free color pixel sensor using gated PIN photodiodes and machine learning techniques JB Junior, A Pereira, R Buhler, A Perin, C Novo, M Galeti, J Oliveira, ... Microelectronics Journal 120, 105337, 2022	7	2022
Assessment of ionizing radiation hardness of a GaN field-effect transistor ACV Bôas, MAA de Melo, RBB Santos, RC Giacomini, NH Medina, ... 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2019	7	2019
Cross-section shape influence on trapezoidal triple-gate SOI MOSFET analog parameters RT Bühler, JA Martino, MA Pavanello, R Giacomini Proceedings of EuroSOI 2009 1, 49-50, 2009	7	2009
Influence of non-vertical sidewall on FinFET threshold voltage R Giacomini, JA Martino ECS Transactions 4 (1), 275, 2007	7	2007

The system can't perform the operation now. Try again later.

Articles 1–20

Citations per year

Duplicate citations

Merged citations

Add co-authorsCo-authors

Follow

Cited by

Co-authors