Jun.-Prof. Hussam Amrouch
Jun.-Prof. Hussam Amrouch
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Towards interdependencies of aging mechanisms
H Amrouch, VM van Santen, T Ebi, V Wenzel, J Henkel
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 478-485, 2014
702014
Reliability-aware design to suppress aging
H Amrouch, B Khaleghi, A Gerstlauer, J Henkel
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6, 2016
652016
Improving mobile gaming performance through cooperative CPU-GPU thermal management
A Prakash, H Amrouch, M Shafique, T Mitra, J Henkel
2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC), 1-6, 2016
512016
Stress balancing to mitigate NBTI effects in register files
H Amrouch, T Ebi, J Henkel
2013 43rd Annual IEEE/IFIP international conference on Dependable Systems …, 2013
302013
Recent advances in EM and BTI induced reliability modeling, analysis and optimization
SXD Tan, H Amrouch, T Kim, Z Sun, C Cook, J Henkel
Integration 60, 132-152, 2018
292018
Reliability in super-and near-threshold computing: A unified model of RTN, BTI, and PV
VM Van Santen, J Martin-Martinez, H Amrouch, MM Nafria, J Henkel
IEEE Transactions on Circuits and Systems I: Regular Papers 65 (1), 293-306, 2017
272017
Towards aging-induced approximations
H Amrouch, B Khaleghi, A Gerstlauer, J Henkel
Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017
272017
Designing guardbands for instantaneous aging effects
VM van Santen, H Amrouch, J Martin-Martinez, M Nafria, J Henkel
Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016
272016
mDTM: Multi-objective dynamic thermal management for on-chip systems
H Khdr, T Ebi, M Shafique, H Amrouch
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
272014
Negative capacitance transistor to address the fundamental limitations in technology scaling: Processor performance
H Amrouch, G Pahwa, AD Gaidhane, J Henkel, YS Chauhan
IEEE Access 6, 52754-52765, 2018
262018
Impact of BTI on dynamic and static power: From the physical to circuit level
H Amrouch, S Mishra, V van Santen, S Mahapatra, J Henkel
2017 IEEE International Reliability Physics Symposium (IRPS), CR-3.1-CR-3.6, 2017
262017
Aging-aware voltage scaling
VM van Santen, H Amrouch, N Parihar, S Mahapatra, J Henkel
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 576-581, 2016
262016
Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies)
J Henkel, S Pagani, H Amrouch, L Bauer, F Samie
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
242017
Thermal management for dependable on-chip systems
J Henkel, T Ebi, H Amrouch, H Khdr
2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 113-118, 2013
242013
Self-immunity technique to improve register file integrity against soft errors
H Amrouch, J Henkel
2011 24th Internatioal Conference on VLSI Design, 189-194, 2011
242011
Connecting the physical and application level towards grasping aging effects
H Amrouch, J Martin-Martinez, VM van Santen, M Moras, R Rodriguez, ...
2015 IEEE International Reliability Physics Symposium, 3D. 1.1-3D. 1.8, 2015
222015
COOL: control-based optimization of load-balancing for thermal behavior
T Ebi, H Amrouch, J Henkel
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware …, 2012
202012
A simulation study of nbti impact on 14-nm node finfet technology for logic applications: Device degradation to circuit-level interaction
S Mishra, H Amrouch, J Joe, CK Dabhi, K Thakor, YS Chauhan, J Henkel, ...
IEEE Transactions on Electron Devices 66 (1), 271-278, 2018
152018
Analyzing the thermal hotspots in FPGA-based embedded systems
H Amrouch, T Ebi, J Schneider, S Parameswaran, J Henkel
2013 23rd International Conference on Field programmable Logic and …, 2013
142013
Lucid infrared thermography of thermally-constrained processors
H Amrouch, J Henkel
2015 IEEE/ACM International Symposium on Low Power Electronics and Design …, 2015
132015
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