| Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise X Jiang, K Wang, F Gao, H Muhamedsalih Applied optics 49 (15), 2903-2909, 2010 | 149 | 2010 |
| Surface and thickness measurement of a transparent film using wavelength scanning interferometry F Gao, H Muhamedsalih, X Jiang Optics express 20 (19), 21450-21456, 2012 | 84 | 2012 |
| Comparison study of algorithms and accuracy in the wavelength scanning interferometry H Muhamedsalih, F Gao, X Jiang Applied optics 51 (36), 8854-8862, 2012 | 32 | 2012 |
| Application of clustering filter for noise and outlier suppression in optical measurement of structured surfaces S Lou, D Tang, W Zeng, T Zhang, F Gao, H Muhamedsalih, X Jiang, ... IEEE Transactions on Instrumentation and Measurement 69 (9), 6509-6517, 2020 | 26 | 2020 |
| Implementation of in process surface metrology for R2R flexible PV barrier films M Elrawemi, L Blunt, H Muhamedsalih, F Gao, L Fleming International Journal of Automation Technology 9 (3), 312-321, 2015 | 25 | 2015 |
| Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noise H Muhamedsalih, X Jiang, F Gao Procedia CIRP 10, 70-76, 2013 | 24 | 2013 |
| Fabrication and characterisation of metal-doped pectin films I Kalathaki, K Alba, H Muhamedsalih, V Kontogiorgos Food Hydrocolloids 92, 259-266, 2019 | 22 | 2019 |
| Investigation of wavelength scanning interferometry for embedded metrology H Muhamedsalih University of Huddersfield, 2013 | 15 | 2013 |
| Single-shot RGB polarising interferometer H Muhamedsalih, S Al-Bashir, F Gao, X Jiang Interferometry XIX 10749, 52-57, 2018 | 13 | 2018 |
| Improvement of the fringe analysis algorithm for wavelength scanning interferometry based on filter parameter optimization T Zhang, F Gao, H Muhamedsalih, S Lou, H Martin, X Jiang Applied optics 57 (9), 2227-2234, 2018 | 13 | 2018 |
| An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process H Muhamedsalih, L Blunt, H Martin, I Hamersma, M Elrawemi, G Feng euspen, 2015 | 13 | 2015 |
| Comparison of fast Fourier transform and convolution in wavelength scanning interferometry H Muhamedsalih, X Jiang, F Gao Optical Measurement Systems for Industrial Inspection VII 8082, 231-238, 2011 | 11 | 2011 |
| In-line metrology of functional surfaces with a focus on defect assessment on large area Roll to Roll substrates L Blunt, L Fleming, M Elrawemi, D Robbins, H Muhamedsalih euspen 1, 71-74, 2013 | 10 | 2013 |
| Vibration compensation of wavelength scanning interferometer for in-process surface inspection H Muhamedsalih, X Jiang, F Gao University of Huddersfield, 2010 | 7 | 2010 |
| Burg algorithm for enhancing measurement performance in wavelength scanning interferometry R Woodcock, H Muhamedsalih, H Martin, X Jiang Surface Topography: Metrology and Properties 4 (2), 024003, 2016 | 6 | 2016 |
| Vertical axis non-linearities in wavelength scanning interferometry G Moschetti, H Muhamedsalih, D Connor, X Jiang, RK Leach In: Laser Metrology and Machine Performance XI, LAMDAMAP 2015. Huddersfield …, 2015 | 6 | 2015 |
| In-line metrology for defect assessment on large area Roll 2 Roll substrates L Blunt, M Elrawemi, L Fleming, D Robbins, H Muhamedsalih Curran Associates, 2014 | 6 | 2014 |
| In-situ defect detection systems for R2R flexible PV barrier films F Gao, H Muhamedsalih, D Tang, M Elrawemi, L Blunt, X Jiang, S Edge, ... 2015 International Conference on Optical Instruments and Technology …, 2015 | 5 | 2015 |
| Comparative study between online and offline defect assessment methods for roll to roll flexible PV modules M Elrawemi, H Muhamedsalih, L Blunt, L Fleming, H Martin, X Jiang | 5 | 2014 |
| An interferometric auto-focusing method for on-line defect assessment on a roll-to-roll process using wavelength scanning interferometry H Muhamedsalih, L Blunt, H Martin, X Jiang, M Elrawemi euspen, 2014 | 5 | 2014 |
