| Heavy ions induced single event upsets testing of the 28 nm Xilinx Zynq-7000 all programmable SoC LA Tambara, FL Kastensmidt, NH Medina, N Added, VAP Aguiar, ... 2015 IEEE Radiation Effects Data Workshop (REDW), 1-6, 2015 | 48 | 2015 |
| Analyzing the impact of radiation-induced failures in programmable SoCs LA Tambara, P Rech, E Chielle, J Tonfat, FL Kastensmidt IEEE Transactions on Nuclear Science 63 (4), 2217-2224, 2016 | 46 | 2016 |
| Register file criticality and compiler optimization effects on embedded microprocessor reliability FM Lins, LA Tambara, FL Kastensmidt, P Rech IEEE Transactions on Nuclear Science 64 (8), 2179-2187, 2017 | 42 | 2017 |
| Reliability on ARM processors against soft errors through SIHFT techniques E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ... IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016 | 40 | 2016 |
| S-SETA: Selective software-only error-detection technique using assertions E Chielle, GS Rodrigues, FL Kastensmidt, S Cuenca-Asensi, LA Tambara, ... IEEE transactions on Nuclear Science 62 (6), 3088-3095, 2015 | 40 | 2015 |
| Evaluating soft core RISC-V processor in SRAM-based FPGA under radiation effects AB de Oliveira, LA Tambara, F Benevenuti, LAC Benites, N Added, ... IEEE Transactions on Nuclear Science 67 (7), 1503-1510, 2020 | 39 | 2020 |
| On the reliability of linear regression and pattern recognition feedforward artificial neural networks in FPGAs F Libano, P Rech, L Tambara, J Tonfat, F Kastensmidt IEEE Transactions on Nuclear Science 65 (1), 288-295, 2017 | 38 | 2017 |
| Laser testing methodology for diagnosing diverse soft errors in a nanoscale SRAM-Based FPGA FL Kastensmidt, L Tambara, DV Bobrovsky, AA Pechenkin, AY Nikiforov IEEE Transactions on Nuclear Science 61 (6), 3130-3137, 2014 | 37 | 2014 |
| Method to analyze the susceptibility of HLS designs in SRAM-based FPGAs under soft errors J Tonfat, L Tambara, A Santos, F Kastensmidt Applied Reconfigurable Computing: 12th International Symposium, ARC 2016 …, 2016 | 32 | 2016 |
| Multiple fault injection platform for SRAM-based FPGA based on ground-level radiation experiments J Tarrillo, J Tonfat, L Tambara, FL Kastensmidt, R Reis 2015 16th Latin-American Test Symposium (LATS), 1-6, 2015 | 29 | 2015 |
| On the characterization of embedded memories of Zynq-7000 all programmable SoC under single event upsets induced by heavy ions and protons LA Tambara, A Akhmetov, DV Bobrovsky, FL Kastensmidt 2015 15th European Conference on Radiation and Its Effects on Components and …, 2015 | 23 | 2015 |
| Analyzing reliability and performance trade-offs of HLS-based designs in SRAM-based FPGAs under soft errors LA Tambara, J Tonfat, A Santos, FL Kastensmidt, NH Medina, N Added, ... IEEE Transactions on Nuclear Science 64 (2), 874-881, 2017 | 22 | 2017 |
| Exploring performance overhead versus soft error detection in lockstep dual-core arm Cortex-A9 processor embedded into Xilinx Zynq APSOC ÁB de Oliveira, LA Tambara, FL Kastensmidt Applied Reconfigurable Computing: 13th International Symposium, ARC 2017 …, 2017 | 18 | 2017 |
| Applying lockstep in dual-core ARM Cortex-A9 to mitigate radiation-induced soft errors ÁB de Oliveira, LA Tambara, FL Kastensmidt 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2017 | 16 | 2017 |
| Exploring design diversity redundancy to improve resilience in mixed-signal systems CP Chenet, LA Tambara, GM de Borges, F Kastensmidt, MS Lubaszewski, ... microelectronics Reliability 55 (12), 2833-2844, 2015 | 16 | 2015 |
| Applying TMR in hardware accelerators generated by high-level synthesis design flow for mitigating multiple bit upsets in SRAM-based FPGAs AF dos Santos, LA Tambara, F Benevenuti, J Tonfat, FL Kastensmidt Applied Reconfigurable Computing: 13th International Symposium, ARC 2017 …, 2017 | 15 | 2017 |
| Evaluating the effectiveness of a diversity TMR scheme under neutrons LA Tambara, FL Kastensmidt, JR Azambuja, E Chielle, F Almeida, ... 2013 14th European Conference on Radiation and Its Effects on Components and …, 2013 | 13 | 2013 |
| Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC L Tambara, F Kastensmidt, P Rech, T Balen, M Lubaszewski 2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 188-193, 2013 | 11 | 2013 |
| Reliability on ARM processors against soft errors by a purely software approach E Chielle, F Rosa, GS Rodrigues, LA Tambara, FL Kastensmidt, R Reis, ... 2015 15th European Conference on Radiation and Its Effects on Components and …, 2015 | 10 | 2015 |
| Measuring failure probability of coarse and fine grain TMR schemes in SRAM-based FPGAs under neutron-induced effects LA Tambara, F Almeida, P Rech, FL Kastensmidt, G Bruni, C Frost Applied Reconfigurable Computing: 11th International Symposium, ARC 2015 …, 2015 | 10 | 2015 |
