Three-dimensional microstructural characterization using focused ion beam tomography MD Uchic, L Holzer, BJ Inkson, EL Principe, P Munroe
MRS bulletin 32 (5), 408-416, 2007
263 2007 A sinusoidally-architected helicoidal biocomposite NA Yaraghi, N Guarín-Zapata, LK Grunenfelder, E Hintsala, S Bhowmick, ...
arXiv preprint arXiv:1604.07798, 2016
196 2016 DA Cole, JR Shallenberger, SW Novak, RL Moore, MJ Edgell, SP Smith, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
118 2000 Thin dielectric film thickness determination by advanced transmission electron microscopy AC Diebold, B Foran, C Kisielowski, DA Muller, SJ Pennycook, E Principe, ...
Microscopy and Microanalysis 9 (6), 493-508, 2003
78 2003 Process control for optimal PCR performance in glass microstructures TB Taylor, SE Harvey, M Albin, L Lebak, Y Ning, I Mowat, T Schuerlein, ...
Biomedical Microdevices 1, 65-70, 1998
50 1998 Oxide thickness determination by xps, aes, sims, rbs and tem JR Shallenberger, DA Cole, SW Novak, RL Moore, MJ Edgell, SP Smith, ...
1998 International Conference on Ion Implantation Technology. Proceedings …, 1998
39 1998 Steps toward automated deprocessing of integrated circuits EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ...
ISTFA 2017: Proceedings from the 43rd International Symposium for Testing …, 2017
37 2017 Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy E Principe
US Patent 7,312,448, 2007
35 2007 Benefits of microscopy with super resolution C Kisielowski, E Principe, B Freitag, D Hubert
Physica B: Condensed Matter 308, 1090-1096, 2001
33 2001 Role of oxide/metal interface in corrosion resistance: Al-W and Al-Mo systems EL Principe, BA Shaw, GD Davis
Corrosion 59 (4), 295-313, 2003
30 2003 FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources FA Stevie, L Sedlacek, P Babor, J Jiruse, E Principe, K Klosova
Surface and Interface Analysis 46 (S1), 285-287, 2014
17 2014 Plasma FIB deprocessing of integrated circuits from the backside EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ...
FICS Research Annual Conference on Cybersecurity, 2017
15 2017 Biocomposites: a sinusoidally architected helicoidal biocomposite (Adv. Mater. 32/2016) NA Yaraghi, N Guarín‐Zapata, LK Grunenfelder, E Hintsala, S Bhowmick, ...
Advanced Materials 28 (32), 6769-6769, 2016
15 2016 A three beam approach to TEM preparation using in-situ low voltage argon ion final milling in a FIB-SEM instrument EL Principe, P Gnauck, P Hoffrogge
Microscopy and Microanalysis 11 (S02), 830-831, 2005
15 2005 Strain and bond length dynamics upon growth and transfer of graphene by NEXAFS spectroscopy from first-principles and experiment WY Rojas, AD Winter, J Grote, SS Kim, RR Naik, AD Williams, C Weiland, ...
Langmuir 34 (4), 1783-1794, 2018
14 2018 High-density FIB-SEM tomography via real-time imaging E Principe
US Patent 8,178,838, 2012
12 * 2012 High-density FIB-SEM tomography via real-time imaging E Principe
US Patent 7,750,293, 2010
12 2010 Advanced Package FA Flow for Next-Gen Packaging Technology Using EOTPR, 3D X-Ray and Plasma FIB C Schmidt, PS Pichumani, J Alton, M Igarashi, L Chan, E Principe
ISTFA 2016, 427-431, 2016
10 2016 Three dimensional imaging of microelectronic devices using a crossbeam FIB E Lifshin, J Evertsen, E Principe, J Friel
ISTFA 2004, 429-435, 2004
7 2004 Technical Note: Observations Regarding the Effects of Nitrogen Addition to the Aluminum-Tungsten System by Reactive Sputter DepositionEL Principe, BA Shaw
Corrosion 53 (9), 675-678, 1997
7 1997 