Edward Principe
Edward Principe
Synchrotron Research, Inc
E-mail confirmado em synchres.com - Página inicial
Título
Citado por
Citado por
Ano
Focused ion beam systems: basics and applications
N Yao
Cambridge University Press, 2007
2372007
Three-dimensional microstructural characterization using focused ion beam tomography
MD Uchic, L Holzer, BJ Inkson, EL Principe, P Munroe
MRS bulletin 32 (5), 408-416, 2007
2122007
thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering …
DA Cole, JR Shallenberger, SW Novak, RL Moore, MJ Edgell, SP Smith, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000
982000
A sinusoidally architected helicoidal biocomposite
NA Yaraghi, N Guarín‐Zapata, LK Grunenfelder, E Hintsala, S Bhowmick, ...
Advanced Materials 28 (32), 6835-6844, 2016
752016
Thin dielectric film thickness determination by advanced transmission electron microscopy
AC Diebold, B Foran, C Kisielowski, DA Muller, SJ Pennycook, E Principe, ...
712003
Process control for optimal PCR performance in glass microstructures
TB Taylor, SE Harvey, M Albin, L Lebak, Y Ning, I Mowat, T Schuerlein, ...
Biomedical Microdevices 1 (1), 65-70, 1998
431998
Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy
E Principe
US Patent 7,312,448, 2007
312007
Oxide thickness determination by XPS, AES, SIMS, RBS and TEM
JR Shallenberger, DA Cole, SW Novak, RL Moore, MJ Edgell, SP Smith, ...
1998 International Conference on Ion Implantation Technology. Proceedings …, 1998
301998
Benefits of microscopy with super resolution
C Kisielowski, E Principe, B Freitag, D Hubert
Physica B: Condensed Matter 308, 1090-1096, 2001
292001
Role of oxide/metal interface in corrosion resistance: Al-W and Al-Mo systems
EL Principe, BA Shaw, GD Davis
Corrosion 59 (4), 295-313, 2003
222003
Steps toward automated deprocessing of integrated circuits
EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ...
ISTFA 2017: Proceedings from the 43rd International Symposium for Testing …, 2017
122017
A three beam approach to TEM preparation using in-situ low voltage argon ion final milling in a FIB-SEM instrument
EL Principe, P Gnauck, P Hoffrogge
Microscopy and Microanalysis 11 (S02), 830-831, 2005
112005
High-density FIB-SEM tomography via real-time imaging
E Principe
US Patent 7,750,293, 2010
102010
High-density FIB-SEM tomography via real-time imaging
E Principe
US Patent 8,178,838, 2012
9*2012
Plasma FIB deprocessing of integrated circuits from the backside
EL Principe, N Asadizanjani, D Forte, M Tehranipoor, R Chivas, ...
FICS Research Annual Conference on Cybersecurity, 2017
82017
Biocomposites: a sinusoidally architected helicoidal biocomposite (Adv. Mater. 32/2016)
NA Yaraghi, N Guarín‐Zapata, LK Grunenfelder, E Hintsala, S Bhowmick, ...
Advanced Materials 28 (32), 6769-6769, 2016
82016
Technical Note: Observations Regarding the Effects of Nitrogen Addition to the Aluminum-Tungsten System by Reactive Sputter Deposition
EL Principe, BA Shaw
Corrosion 53 (9), 675-678, 1997
81997
Strain and Bond Length Dynamics upon Growth and Transfer of Graphene by NEXAFS Spectroscopy from First-Principles and Experiment
WY Rojas, AD Winter, J Grote, SS Kim, RR Naik, AD Williams, C Weiland, ...
Langmuir 34 (4), 1783-1794, 2018
72018
Three dimensional imaging of microelectronic devices using a crossbeam FIB
E Lifshin, J Evertsen, E Principe, J Friel
Proceedings of the 12th International Symposium on the Physical and Failure …, 2005
72005
Advanced Package FA flow for next-gen packaging technology using EOTPR 3D XRAY & Plasma FIB
C Schmidt, PS Pichumani, J Alton, M Igarashi, L Chan, E Principe
International Symposium for Testing and Failure Analysis (ISTFA), 2016
62016
O sistema não pode executar a operação agora. Tente novamente mais tarde.
Artigos 1–20