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Luís Eduardo Seixas Jr (L.E.Seixas) http://lattes.cnpq.br/5540461190153989
Luís Eduardo Seixas Jr (L.E.Seixas) http://lattes.cnpq.br/5540461190153989
Other namesLuís Eduardo Seixas Jr (L.E.Seixas), http://lattes.cnpq.br/5540461190153989
CTI, Centro de Tecnologia da Informação Renato Archer
Verified email at cti.gov.br - Homepage
Title
Cited by
Cited by
Year
Experimental setup for single event effects at the são paulo 8ud pelletron accelerator
VAP Aguiar, N Added, NH Medina, ELA Macchione, MH Tabacniks, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
452014
Ionizing radiation hardness tests of GaN HEMTs for harsh environments
ACV Bôas, MAA de Melo, RBB Santos, R Giacomini, NH Medina, ...
Microelectronics Reliability 116, 114000, 2021
272021
Performance of electronic devices submitted to X-rays and high energy proton beams
MAG Silveira, KH Cirne, RBB Santos, SP Gimenez, NH Medina, N Added, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
172012
Study of proton radiation effects among diamond and rectangular gate MOSFET layouts
LE Seixas, S Finco, MAG Silveira, NH Medina, SP Gimenez
Materials Research Express 4 (1), 015901, 2017
162017
Improving MOSFETs’ TID tolerance through diamond layout style
LE Seixas, OL Goncalez, R Souza, S Finco, RG Vaz, GA Da Silva, ...
IEEE Transactions on Device and Materials Reliability 17 (3), 593-595, 2017
152017
SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil
VAP Aguiar, NH Medina, N Added, ELA Macchione, SG Alberton, ...
Review of Scientific Instruments 91 (5), 2020
142020
Minimizing the TID effects due to gamma rays by using diamond layout for MOSFETs
LE Seixas, S Finco, O Gonçalez, AC da Costa Telles, RG Vaz, ...
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 1, 1-13, 2019
132019
First successful SEE measurements with heavy ions in Brazil
NH Medina, MAG Silveira, N Added, VAP Aguiar, R Giacomini, ...
2014 IEEE Radiation Effects Data Workshop (REDW), 1-3, 2014
82014
Comparative study of the proton beam effects between the conventional and Circular-Gate MOSFETs
K Cirne, MAG Silveira, RBB Santos, SP Gimenez, MDL Barbosa, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
82012
Assessment of ionizing radiation hardness of a GaN field-effect transistor
ACV Bôas, MAA de Melo, RBB Santos, RC Giacomini, NH Medina, ...
2019 34th Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2019
72019
A new test environment approach to SEE detection in MOSFETs
LE Seixas, MAG Silveira, NH Medina, VAP Aguiar, N Added, SP Gimenez
Advanced Materials Research 1083, 197-201, 2015
72015
X-ray radiation effects in circular-gate transistors
KH Cirne, M Silveira, JA De Lima, LE Seixas, SP Gimenez
ECS Transactions 35 (5), 259, 2011
72011
Radiation hardness of GaN HEMTs to TID effects: COTS for harsh environments
ACV Bôas, MAA De Melo, RBB Santos, R Giacomini, NH Medina, ...
2019 19th European Conference on Radiation and Its Effects on Components and …, 2019
62019
A Commercial off-the-shelf pMOS Transistor as X-ray and Heavy Ion Detector
MAG Silveira, MAA Melo, VAP Aguiar, A Rallo, RBB Santos, NH Medina, ...
Journal of Physics: Conference Series 630 (1), 012012, 2015
62015
Boosting the Ionizing Radiation Tolerance in the Mosfets Matching by Using Diamond Layout Style
LES Peruzzi, Vinicius Vono, Willian Souza da Cruz, Gabriel Augusto da Silva ...
2019 34th Symposium on Microelectronics Technology and Devices (SBMicro), 2019
5*2019
Experimental Comparative Study of the X-Ray Radiation Effects Between the Threshold Voltages of the Diamond and Conventional Layout Styles
DM Alati, SP Gimenez, MAG Silveira, LE Seixas, W Melo
EURO SOI, 53-54, 2012
52012
Radiation Hardened Latching Current Limiter for Space Applications
AV Dias, S Manea, J Moreira, RHG Chacón, ÂA dos Santos, S Finco, ...
2023 IEEE Aerospace Conference, 1-9, 2023
32023
Reliability analysis of gamma-and X-ray TID effects, on a commercial AlGaN/GaN based FET
ACV Bôas, SG Alberton, N Medina, VÂ Paulino, MAA Melo, RB Santos, ...
Journal of Integrated Circuits and Systems 16 (3), 1-7, 2021
32021
A lowcost pre-amplifier for current measurement in sub-nA range
ACC Telles, JL Emeri Jr, S Finco, LE Seixas
Proceedings of XIII Workshop on Semiconductors and Micro & Nano Technologies …, 2018
32018
Overview about radiation–matter interaction mechanisms and mitigation techniques
RNS Raphael, LE Seixas Jr, AM Pinto Jr, SA Bascopé, LT Manera, ...
Brazilian Technology Symposium, 223-238, 2017
22017
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