| An efficient EDAC approach for handling multiple bit upsets in memory array RC Goerl, PRC Villa, LB Poehls, EA Bezerra, FL Vargas Microelectronics Reliability 88, 214-218, 2018 | 15 | 2018 |
| Analysis of single-event upsets in a Microsemi ProAsic3E FPGA PRC Villa, RC Goerl, F Vargas, LB Poehls, NH Medina, N Added, ... 2017 18th IEEE Latin American Test Symposium (LATS), 1-4, 2017 | 13 | 2017 |
| Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits R Goerl, P Villa, FL Vargas, CA Marcon, NH Medina, N Added, ... Microelectronics Reliability 100, 113341, 2019 | 7 | 2019 |
| Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID P Villa, E Bezerra, R Goerl, L Poehls, F Vargas, N Medina, N Added, ... 2017 11th International Workshop on the Electromagnetic Compatibility of …, 2017 | 7 | 2017 |
| PCoSA: A product error correction code for use in memory devices targeting space applications D Freitas, D Mota, R Goerl, C Marcon, F Vargas, J Silveira, J Mota Integration 74, 71-80, 2020 | 6 | 2020 |
| A new approach to guarantee critical task schedulability in tdma-based bus access of multicore architecture E Lara, G Debon, R Goerl, P Villa, D Schramm, LB Poehls, F Vargas 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 6 | 2019 |
| Fault tolerant soft-core processor architecture based on temporal redundancy PRC Villa, R Travessini, RC Goerl, FL Vargas, EA Bezerra Journal of Electronic Testing 35, 9-27, 2019 | 4 | 2019 |
| Optimizing RISC-V ISA Usage by Sharing Coprocessors on MPSoC P Lima, C Vieira, J Reis, A Almeida, J Silveira, R Goerl, C Marcon 2020 IEEE Latin-American Test Symposium (LATS), 1-5, 2020 | 2 | 2020 |
| Error Coverage, Reliability and Cost Analysis of Fault Tolerance Techniques for 32-bit Memories used on Space Missions DCC Freitas, D Mota, D Simões, C Lopes, R Goerl, C Marcon, J Silveira, ... 2020 21st International Symposium on Quality Electronic Design (ISQED), 250-254, 2020 | 1 | 2020 |
| Analysis of conducted-EMI noise influence on the effectiveness of an EDAC technique to mitigate soft errors in ionizing radiation environment R Goerl, P Villa, F Vargas, NH Medina, N Added, VAP de Aguiar, ... 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 …, 2018 | 1 | 2018 |
Paulo VillaIFSulVerified email at ifsul.edu.br
